Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...
Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...
Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...
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JUNE 28 WEDNESDAY MORNING<br />
WeM-Pl.3 FUNCTIONAL CERAMIC THIN FILMS, NEW MATERIALS FOR THE<br />
FUTURE, FROM NATURALLY NANOLAMINATED MAX-PHASES TO TAILORED<br />
NANOCOMPOSITES OF CARBIDES, OXIDES AND NITRIDES. H. Högberg, Thin Film<br />
Physics Division, Department of Physics (IFM), Linköping University, SE-58183 Linköping, Sweden.<br />
There is a strong desire to design a material with properties that match the demands foreseen in future<br />
applications. Thus, the development of functional materials is gaining increased attention in materials<br />
science today. This presentation focuses on two such highly promising branches of functional<br />
thin films, namely the layered ternary ceramic compounds known as the M n+1 AX n (n=1-3) phases,<br />
where M is an early transition metal (Ti, Nb), A is a group 13-15 element (Al, Si, Ge), and (X) is either<br />
C or N, and nanocomposites from the TiC/SiC, TiN/SiN x and ZrO 2 /Al 2 O 3 systems. A limited<br />
miscibility for one of the constituents is inherent to all of these systems, which causes segregation of<br />
the element during synthesis. For the MAX phases, typically synthesized as bulk materials at temperatures<br />
of ∼1300 o C, the process yields an anisotropic crystal structure in which MX blocks are interleaved<br />
by pure A-element layers. This nanolaminated structure give rise to the unique set of properties<br />
for these materials as reported by Barsoum et al. Typically the MAX phases show high oxidation<br />
resistance in combination with good thermal and electrical conductivities. These attributes are<br />
also ideal for advanced thin film applications were multi-functionality is required at elevated temperatures<br />
and/or harsh environment. Recently, we have developed dc magnetron sputtering processes<br />
for the growth of MAX-phase thin films from the systems Ti-A-C, A=Al, Si, Ge, or Sn, using either<br />
growth from elemental sources or Ti 3 SiC 2 and Ti 2 AlC (MAXTHAL®) targets. The processes enables<br />
the growth of epitaxial thin films on Al 2 O 3 (0001) substrates at substrate temperatures in the region<br />
700-1000 o C, including known bulk phases such as Ti 2 GeC, Ti 2 SnC, Ti 3 SiC 2 , and Ti 3 GeC 2 as<br />
well as new phases Ti 4 SiC 3 , Ti 4 GeC 3 , and Ti 3 SnC 2 . Characterization with four-point probe resistivity<br />
measurements shows that our thin films are good conductors. Nanoindentation confirms the ductile<br />
deformation behavior of the MAX phases and reveals details on the formation of pile up.<br />
For the nanocomposite thin films from particularly the TiN/SiN x system the pioneering work by<br />
Vepřek et al has provided invaluable knowledge regarding the microstructure design of films with<br />
improved properties. Their studies show that increased hardness is only achieved when the secondary<br />
amorphous phase (SiN x ) form a 1-2 monolayer thick tissue around small (