Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...
Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...
Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...
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JUNE 26 MONDAY MORNING<br />
ETCHC-MoM-OR.3 STUDY OF HYDROGEN AND OXYGEN UPTAKE IN SMART<br />
OPTICAL WINDOWS BASED ON YPd AND MgNiPd THIN FILMS BY GDOES. E. Matveeva,<br />
E.Rayon. Centro MTM, Universidad Politécnica de Valencia, Cami de Vera s/n, E-46022<br />
Valencia Spain. R. Escobar Galindo, J.M. Albella. Departamento Física en Ingeniería de Superficies,<br />
Instituto Ciencia de Materiales, Cantoblanco, E-28049 Madrid, Spain.<br />
The use of smart optical windows based on YPd and MgNiPd thin coatings on transparent glass, has<br />
been extensively studied in the last 15 years due to the possibilities of switching the optical and electrical<br />
properties in a reversible and controlled way. The key of the switching process is based on the<br />
absorption of hydrogen by the reflective metal, converting it to a transparent and semiconductor<br />
metal hydride. In our case, the control of the hydration is carried out by an electrochemical process<br />
in which the hydrogen ions are absorbed onto the metallic cathode. During the anodic discharge, the<br />
hydrogen is released from the metal hydride towards the alkali electrolyte where other reactions may<br />
take place (i.e. metal oxidation). These complex processes are localised in-depth the film thickness<br />
(approximately 200 nm) and at the interfaces. Incontrollable oxidation of the active films during anodic<br />
discharge depending on the position in the film of the oxide formed can block the hydrogen diffusion<br />
process and reduce hydrogenation limiting the lifetime of the devices. Therefore, it is crucial<br />
to have a detailed knowledge of the mechanisms of hydrogen and oxygen uptake and release in the<br />
films. Most of the previous studies has been done by X-ray and infrared characterisation techniques,<br />
but they do not provide depth profile information.<br />
As an alternative, in this work, we have made use of the high elemental sensitivity and nanometre<br />
depth resolution of radiofrequency Glow Discharge Optical Emission Spectroscopy (rf-GDOES) to<br />
study the depth profiles of the elements present in the films. In particular, the hydrogen and oxygen<br />
uptake and release was followed in samples subjected to different charge and discharge processes.<br />
GDOES measurements were performed after each electrochemical experiment (charging and discharging),<br />
whose kinetics was recorded,. The most representative observations of the GDOES results<br />
were: i) The resolution of the layer structure of the film (5 nm Pd/metal layer/glass), ii) the detection<br />
and monitoring of hydrogen migration in and out of the film during loading and release cycles and<br />
iii) the revelation of the enhanced oxidation of the film after an anodic discharge. The relation of<br />
these observations with the performance of the devices will be further discussed in this paper.<br />
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