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Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...

Wüest M. 51 Wykes M. 82 Yamaguchi M. 17 Ybarra G. 129 Yubero F ...

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JUNE 26 MONDAY MORNING<br />

ETCHC-MoM-OR.3 STUDY OF HYDROGEN AND OXYGEN UPTAKE IN SMART<br />

OPTICAL WINDOWS BASED ON YPd AND MgNiPd THIN FILMS BY GDOES. E. Matveeva,<br />

E.Rayon. Centro MTM, Universidad Politécnica de Valencia, Cami de Vera s/n, E-46022<br />

Valencia Spain. R. Escobar Galindo, J.M. Albella. Departamento Física en Ingeniería de Superficies,<br />

Instituto Ciencia de Materiales, Cantoblanco, E-28049 Madrid, Spain.<br />

The use of smart optical windows based on YPd and MgNiPd thin coatings on transparent glass, has<br />

been extensively studied in the last 15 years due to the possibilities of switching the optical and electrical<br />

properties in a reversible and controlled way. The key of the switching process is based on the<br />

absorption of hydrogen by the reflective metal, converting it to a transparent and semiconductor<br />

metal hydride. In our case, the control of the hydration is carried out by an electrochemical process<br />

in which the hydrogen ions are absorbed onto the metallic cathode. During the anodic discharge, the<br />

hydrogen is released from the metal hydride towards the alkali electrolyte where other reactions may<br />

take place (i.e. metal oxidation). These complex processes are localised in-depth the film thickness<br />

(approximately 200 nm) and at the interfaces. Incontrollable oxidation of the active films during anodic<br />

discharge depending on the position in the film of the oxide formed can block the hydrogen diffusion<br />

process and reduce hydrogenation limiting the lifetime of the devices. Therefore, it is crucial<br />

to have a detailed knowledge of the mechanisms of hydrogen and oxygen uptake and release in the<br />

films. Most of the previous studies has been done by X-ray and infrared characterisation techniques,<br />

but they do not provide depth profile information.<br />

As an alternative, in this work, we have made use of the high elemental sensitivity and nanometre<br />

depth resolution of radiofrequency Glow Discharge Optical Emission Spectroscopy (rf-GDOES) to<br />

study the depth profiles of the elements present in the films. In particular, the hydrogen and oxygen<br />

uptake and release was followed in samples subjected to different charge and discharge processes.<br />

GDOES measurements were performed after each electrochemical experiment (charging and discharging),<br />

whose kinetics was recorded,. The most representative observations of the GDOES results<br />

were: i) The resolution of the layer structure of the film (5 nm Pd/metal layer/glass), ii) the detection<br />

and monitoring of hydrogen migration in and out of the film during loading and release cycles and<br />

iii) the revelation of the enhanced oxidation of the film after an anodic discharge. The relation of<br />

these observations with the performance of the devices will be further discussed in this paper.<br />

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