sodininkystė ir daržininkystė 31(3–4)

Wa v e l e n g t h - d i s p e r s i v e X - R a y f l u o r e s c e n c e ( W D X R F )a n a l y s i s: A WDXRF spectrometer (Rigaku ZSX-100e with Rhodium targetX-ray, Rigaku, Japan) was used for the analysis of the seed element content. Thisinstrument was controlled by a computer using ZSX Software (Rigaku, Japan). TheZSX 100e WDXRF spectrometer characteristics included; analysis of elements fromB to U, 4 kW 70 kV end-window X-ray tube, micro area mapping down to 0.5 mm,up to five primary beam filters, 4 analyzing crystals [LiF, Ge (111), PET (002) andTAP (100)], and eight limiting area diaphragms, optional secondary collimators, automaticsample changer, compact design and multi window, multi-function fundamentalparameters software.Seed was grinded in a porcelain muller. The ground material was used for all XRFanalyses. In the XRF Laboratory, 2 g weight, 2.5 mm thickness and 35 mm diameterpellets were produced by applying 15 t of pressure with a Spex press (Cat. B25). Afterthe preparation of the pellets, they were incubated at 80 °C for 20 min to remove allmoisture and were then used for element determination. LiF, Ge (111), PET (002)and TAP (100) crystals were used to separate the X rays coming from the pellets inWDXRF spectrometer. At the end of the WDXRF analysis; the major, minor and traceelement contents of seeds were determined as mass percentage (wt%) (wt% = elementmass × 100 / total mass) (Kaymak et al., 2010 a and 2010 b).E x p e r i m e n t a l d e s i g n a n d s t a t i s t i c a l a n a l y s i s. The laboratoryexperiments were conducted as randomized complete block designs, with fourreplicates. Data obtained were subjected to ANOVA and differences between meanscompared using Duncan’s multiple range test. Additionally, the correlation coefficients(r) between tests were determined.Results and discussion. Means of the green bean cultivars for SGT and GR areshown in Table 1. There were significant differences (P < 0.01) among cultivars forSGT and GR.Table 1. Mean values of germination (%) and germination rate (%) in four beancultivars1 lentelė. Keturių pupelių veislių daigumo (%) ir daigumo lygio vidurkiai (%)CultivarsVeislėsSGTSDTGRDLcv. ‘Gina’ 86.7 ab 31.2 NS / NPcv. ‘Sarıkız’ 96.7 a 31.2cv. ‘Sırık Ayse’ 73.3 b 24.7cv. ‘Balkız’ 95.0 a 29.4SEMSVK3.044 1.378P valuesP reikšmės0.002 0.330Different letters denote significant differences between the cultivars: NS – not significant,SGT – standard germination test, GR – germination rate, SEM: standard error of mean.Skirtingos raidės žymi patikimus skirtumus tarp veislių: NP – nepatikima, SDT – standartinisdaigumo testas, DL – daigumo lygis, SVK – standartinė vidurkio paklaida.49