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Dirac Fermions in Graphene and Graphite—a view from angle ...

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Figure 4.7. Dispersions measured <strong>in</strong> bilayer graphene on 6H-SiC (panel a) <strong>and</strong> more <strong>in</strong>sulat<strong>in</strong>g<br />

4H-SiC (panel b) substrates.<br />

consistent check for the sample thickness determ<strong>in</strong>ed by other methods 37,62 . Panel (d) shows the ARPES<br />

data taken along a l<strong>in</strong>e through the H po<strong>in</strong>t <strong>in</strong> graphite, where the dispersion resembles that of graphene<br />

through K 64 . Data shown <strong>in</strong> panels (a-d) allow us to determ<strong>in</strong>e how the electronic structure near K po<strong>in</strong>t<br />

varies as the sample thickness <strong>in</strong>creases. First of all, as the sample thickness <strong>in</strong>creases, E D shifts toward E F .<br />

From s<strong>in</strong>gle layer to trilayer graphene, E D (marked by arrows <strong>in</strong> panels (a-c)) shifts <strong>from</strong> -0.4 eV to -0.29<br />

eV then to -0.2 eV. For graphite, E D has been estimated to be at ≈0.05 eV above E F 64 . More importantly,<br />

as the sample becomes thicker, the gap (labeled by light blue shaded area <strong>in</strong> panels (a-c)) decreases rapidly.<br />

From s<strong>in</strong>gle layer to trilayer graphene, the gap decreases <strong>from</strong> 0.26 eV to 0.14 eV then to 0.066 eV. For<br />

graphite, s<strong>in</strong>ce the <strong>Dirac</strong> po<strong>in</strong>t energy is above E F 64 , whether there is a gap or not cannot be directly<br />

addressed by ARPES. However, <strong>from</strong> b<strong>and</strong> structure calculation, it is expected that the gap at the H po<strong>in</strong>t<br />

is ≈ 0.008 eV 9,74 , which is almost negligible.<br />

Fig. 4.7 shows comparison of data taken on one bilayer graphene sample on a more <strong>in</strong>sulat<strong>in</strong>g 4H-SiC<br />

substrate with resistivity of 10 5 Ω/cm (panel b) compared to another graphene sample on a 6H-SiC with<br />

resistivity of 0.2 Ω/cm (panel a). In both cases, the <strong>Dirac</strong> po<strong>in</strong>t energy appears to be shifted by a similar<br />

amount below E F , suggest<strong>in</strong>g that the dop<strong>in</strong>g is most likely associated with the surface charges at the<br />

<strong>in</strong>terface, rather than the carrier concentration of the substrate.<br />

Fig. 4.8 summarizes the evolution of the <strong>Dirac</strong> po<strong>in</strong>t energy E D <strong>and</strong> the gap ∆ for various sample<br />

thickness. The layer dependence of both quantities suggests that, beyond 5 layers, epitaxial graphene<br />

behaves as bulk graphite 64 . The amount of dop<strong>in</strong>g should decrease as the sample becomes thicker, because<br />

the surface layer probed by ARPES is farther away <strong>from</strong> the <strong>in</strong>terface as the thickness <strong>in</strong>creases. Also, the<br />

strong dependence of E D on sample thickness is a direct manifestation of the short <strong>in</strong>terlayer screen<strong>in</strong>g length<br />

(≈ 5 layers 75 ) of graphene. This result shows that the sample thickness is an effective way of controll<strong>in</strong>g<br />

dop<strong>in</strong>g <strong>in</strong> epitaxial graphene. Panel(b) shows the dependence of the gap on the sample thickness. A gap<br />

<strong>in</strong> bilayer graphene has been reported <strong>and</strong> attributed to the different potentials <strong>in</strong> the two graphene layers<br />

<strong>in</strong>duced by dop<strong>in</strong>g or electric field 76,77,78 . While this could contribute to the gap <strong>in</strong> bilayer <strong>and</strong> even trilayer<br />

graphene, it certa<strong>in</strong>ly is not the reason for the gap <strong>in</strong> the s<strong>in</strong>gle layer graphene.<br />

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