SCIENTIFIC REPORT 22
6 – NANO- CHARACTERISATION AND NANO-METROLOGY This cross-theme is animated by a scientific committee composed of 5 renowned experts who belong to the main Grenoble institutes. This group helps the community to identify the needs for new instrumental and methodological developments that will improve the sensitivity and scale down the spatial resolution of our instruments to measure physical and structural properties at the nanometer scale. It is worth noting that this effort, started in 2007, has lead a general movement of structuring the cross-theme “Nanocharacterisation and metrology” at the full scale of the Grenoble University. The scientific instrumentation is one of the well identified highly unifying themes of the GUI+ IDEX project. Broad scientific and instrumental activities are relevant of «Nano- Characterisation -Nanometrology», as for instance: Electron (with aberration correction) and x-ray microscopies. These include diffraction, coherent diffraction, spectroscopy, tomography, holography, … Advanced surface/subsurface spectroscopy, surface imaging, and surface crystallography. Atomic Force Microscopy (AFM) (STM), Scanning Tunnelling Microscopy, Scanning Gate Microscopy (SGM), PhotoEmission Electron Microscopy (PEEM), Angle Resolved Photoelectron Spectroscopy (ARPES), Medium Energy Ion Scattering (MEIS), Grazing Incidence X-ray (GISAXS)..., to measure electronic, magnetic and structural properties at the surface and/or subsurface. In operando and in situ studies. In situ X-ray studies, in real time, of nucleation and growth of thin film, nanostructures, … In situ, in operando studies as a function of temperature, external field (electric or magnetic field, stress, electric current), external stress, gas, ... Instrumentation at very low temperature and / or high magnetic field. Nuclear Magnetic Resonance. Cryogenic Nano-detectors, ... Combined techniques. Raman scattering with Atomic Force Microscopy, X-ray spectroscopy with X-ray diffraction … Micro Electro-Mechanical System, Nano Electro Mechanical System. Advanced instrumentation. Manipulation and study of micro- nanosized object (optical tweezers, …), ... The field “Nanocharacterisation” enjoys an exceptional scientific environment: the large scale facilities (ESRF for X rays, ILL for neutrons, Laboratoire National des Champs Magnétiques Intenses (GHMFL) for high magnetic field, ...) and the Léti, a unique expertise in the field of instrumentation at very low temperatures in particular at Institut Néel and Institut des Nanosciences et Cryogénie (INAC), nine technological facilities gathering state of the art instruments (or equipment) excellent clean room-based facilities for nanofabrication (Nanofab at Institut Néel or “Plateforme Technologique Avancée” at MINATEC). One should also mention a strong expertise in surface imaging, including near field spectroscopy, Transmission Electron Microscopy and crystallography. The French Collaborative Research Group at the ESRF, run by <strong>CNRS</strong> and CEA, has set up three dedicated beam lines and developed world leading methods and instruments for studying the growth and structural properties of nanostructures. Several activities in the field of nanocharacterisation and nanometrology benefit of a dedicated Focus Ion Beam dual instrument bought by the Foundation in 2008. In 2009 a Chair of Excellence was granted to Pr John KIRTLEY (Stanford University, USA). In <strong>2010</strong>, it was decided to focus the call applications onto the topic “Coherent Diffraction Imaging at the nanometer scale”. Accordingly, a Chair of Excellence has been granted to Pr Jian Min ZUO (University of Illinois, USA). Fig. 1: Juan Min ZUO, Chair of Excellence <strong>2010</strong> CONTACTS Hubert RENEVIER hubert.renevier@inpg.fr Tel: +33 4 56 52 93 43 Joël CHEVRIER joel.chevrier@grenoble.cnrs.fr Tel: +33 4 76 88 74 63 SCIENTIFIC REPORT 23
- Page 3 and 4: Date of publication: May 2011 We wo
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D. A. Stewart, I. Savic, and N. Min
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DISPOGRAPH / RTRA project Post-doct
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2009 Call for Proposals MUSCADE Cha
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Piotr Laczkowski, Danny Hykel, Serg
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Part IV: SUPPLEMENTS Appendix 1: th
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Appendix 2: the Foundation’s boar
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Appendix 4: the Steering Committee
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RTRA projects support Major topic A
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Appendix 6: 2010 Call for Proposals
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Education and Scientific Animation
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2008 Call for Proposals Name Nation
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Appendix 8: List of the Post Doc Fe
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Appendix 9: List of the PhD student
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PhD students supported in 2010 Name
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Appendix 11: List of the Reviewers
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2010 Call for Proposals Reviewer La
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Nom du laboratoire Département de
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Nom du laboratoire GRENOBLE INSTITU
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Nom du laboratoire Institut de Micr
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Nom du laboratoire Institut Fourier
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Nom du laboratoire Institut Néel I
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Nom du laboratoire Laboratoire d'In
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Nom du laboratoire Laboratoire de P
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SUPPLEMENTS 5 : Très nombreuses vi
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Nom du laboratoire Laboratoire Inte
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Nom du laboratoire Laboratoire Nati
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Nom du laboratoire Techniques de l
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SUPPLEMENTS 48
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HIGHLIGHTS QUANTUM NANOELECTRONICS:
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FIB NANO- TOMOGRAPHY OF DEFECTS IN
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DETECTING SINGLE NANOPARTICLE MAGNE
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QUANTUM HETEROSTRUCTURES IN II-VI N
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ELECMOL’10 CONFERENCE An importan
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CRISTAL PHASE TRANSITIONS IN PRESSU
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SCANNING GATE NANOELECTRONICS In th
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CONTROL OF THERMAL CONDUCTIVITY AT
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Roland HERINO (past Director) Jean-