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Activity Report 2010 - CNRS

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Growth, patterning, defects<br />

& structure of nano-objects.<br />

The elaboration and characterisation of<br />

nano-objects is of primary importance in<br />

nanosciences and requires a mastering of<br />

complex experimental methods.<br />

Numerical simulation is of great help in<br />

understanding the details of the physical<br />

mechanism involved in elaboration<br />

procedure and in interpreting the output<br />

of methods used to analyze the structure<br />

of these objects.<br />

In this context the Nanosciences<br />

Foundation supports so far three Chairs<br />

of Excellence and one PhD student.<br />

Chair of Excellence 2009: Normand<br />

MOUSSEAU<br />

Coordinator: Pascal POCHET<br />

(INAC/SP2M)<br />

This project started in early <strong>2010</strong>. It aims<br />

at coupling a kinetic method (k-ART)<br />

developed by Pr MOUSSEAU and the abinitio<br />

code BigDFT developed initially at<br />

INAC. The new methodology will then be<br />

coupled to study the growth of three<br />

types of nanostructures: SiGe quantum<br />

dots, Si nanowires and graphene on SiC.<br />

The first tests of the new methodology<br />

have already been done on the simpler<br />

system consisting of a fullerene C20.<br />

The goal of this project is therefore to<br />

benefit from the expertise of Pr Graves in<br />

the field of MDS applied to plasmasurface<br />

interactions to assist the fast<br />

development of etching processes of<br />

graphene layers.<br />

“Fil de l’eau” PhD student 2008: Arpan<br />

Krishna DEB<br />

Thesis Director: Thierry DEUTSCH and<br />

Damien CALISTE (INAC/SP2M).<br />

This thesis deals with cluster approach to<br />

simulate defects in Si or Ge. Indeed<br />

working with charged periodic systems is<br />

a bit complicated as it involves the long<br />

range Coulomb forces and it is impossible<br />

to negate the interaction between the<br />

images created due to the periodicity in<br />

the simulation. A very common approach<br />

is to add a neutralizing background<br />

charge. But even this trick does not<br />

completely eliminate the spurious<br />

interaction of the image charges. The<br />

cluster approach clearly avoids these<br />

difficulties and open new possibilities to<br />

treat these defects.<br />

SCIENTIFIC REPORT<br />

Chair of Excellence <strong>2010</strong>: David GRAVES<br />

Coordinator: Gilles CUNGE (LTM).<br />

The Chair of Excellence of Pr GRAVES<br />

(University of California at Berkeley) will<br />

deal with Nanometer Scale Control of<br />

Graphene Processing with Innovative<br />

Plasma Technology (NSCGP). This project<br />

aims to advance nanometer-scale control<br />

of graphene processing using advanced,<br />

innovative plasma technology. In order to<br />

exploit the extraordinary power of plasma<br />

for large area, smooth and damage-free<br />

graphene film growth and patterning, it<br />

will be necessary to take a leap in plasma<br />

technology.<br />

LTM is currently investing such a new<br />

technology: pulsed plasmas. However,<br />

the interactions between reactive<br />

plasmas and surfaces are so complex<br />

that the efficient development of<br />

processes for new materials requires<br />

numerical simulations.<br />

For 20 years, Molecular Dynamic<br />

Simulations (MDS) have proved to be<br />

powerful for this purpose, but this<br />

expertise does not exist locally.<br />

Fig. 5: Cluster of Si used for the simulation of<br />

a defect. Left: cluster with no defect inside.<br />

Right: cluster with one vacancy<br />

.<br />

35

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