biographical summary of robert j. nemanich - Department of Physics ...

98. “Microstructural Defects and their Elimination in Heteroepitaxial GaAs on Silicon-on-
Sapphire and Sapphire Substrates,” J.B. Posthill, N.R. Parikh, K. Das, T.P. Humphreys,
R.J. Nemanich, and R.J. Markunas, Proc. 47th Annual Meeting of the Electron
Microscopy Society of America, edited by G.W. Bailey, 588-589 (1989).
99. “Low Pressure Deposition of Polycrystalline Diamond films using 1% CH4 in H2 rf
Discharges,” R.A. Rudder, G.C. Hudson, M.J. Mantini, J.B. Posthill, R.C. Hendry, R.J.
Markunas, Y.M. LeGrice, And R.J. Nemanich, Technology Update on Diamond Films,
extended absract - 19, edited by R.P.H. Chang, D. Nelson, And A. Hiraki, (Mater. Res.
Soc. Proc., p. 89 (1989).
1990
100. “Ultrafast recombinaton and trapping in amorphous Silicon,” A. Esser, K. Seibert, H. Kurz,
G.N. Parsons, C. Wang, B. Davidson, G. Lucovsky, and R.J. Nemanich, Phys. Rev. B 41,
2879-2884, (1990).
101. “Surface Morphology of TiSi2 on Si, “ H. Jeon, and R.J. Nemanich, Proceedings of the
3rd Int. Symposium on Si MBE and Thin Solid Films 184, 357-363, E. Kasper and E.H.C.
Parker, editors, (1990).
102. “Photoluminescence above the Tauc gap in a-Si:H,” I.H. Campbell, P.M. Fauchet, S.A.
Lyon, and R.J. Nemanich, Phys. Rev. B 41, 9871-9879, (1990).
103. “Analysis of the Composite Structures in Diamond Thin Films using Raman
Spectroscopy,” R.E. Shroder, R.J. Nemanich, and J.T. Glass, Phys. Rev. B 41, 3738-3745,
(1990).
104. “X-Ray Absorption Studies of Titanium Silicide Formation at the Interface of Ti Deposited
on Si,” D. Aldrich, Q. Islam, H. Jeon, R. Nemanich, and D.E. Sayers, Atomic Scale
Structure of Interfaces, edited by R.D. Bringans, R.M. Feenstra, J.M. Gibson. (Mater.
Res. Soc. Symp. Proc., 159, Boston, Massachusetts, p. 167 (1990).
105. “Surface Morphologies and Interfaces of TiSi2 Formed From UHV Deposited Ti on Si,”
H. Jeon, R.J. Nemanich, J.W. Honeycutt, and G.A. Rozgonyi, Layered Structures:
Heterepitaxy, Superlattices, Strain, and Metastability, edited by B.W. Dodson, L.J.
Schowalter, J.E. Cunningham, F.H. Pollak, (Mater. Res. Soc. Symp. Proc., 160, Boston,
MA, p. 307-312 (1990).
106. “Domain Size Determination in Diamond Thin Films,” Y.M. LeGrice, R.J. Nemanich, J.T.
Glass, Y.H. Lee, R.A. Rudder, and R.J. Markunas, Diamond, Silicon carbide and Related
Wide Bandgap Semiconductors, edited by J.T. Glass, R. Messier, N. Fujimori, (Mater.
Res. Soc. Symp. Proc., 162, Boston, MA, p. 219-224 (1990).
107. “Infared Characterization of the Hydrogen Environments in Diamond Thin Films,” Y.M.
LeGrice, E.C. Buehler, R.J. Nemanich, J.T. Glass, K. Kabashi, F. Jansen, M.A. Machonkin
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