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345. “Quantitative analysis <strong>of</strong> a-Si1-xCx:H: H thin films by vibrational spectroscopy and nuclear<br />

methods,” D. Gracin, K. Bogdanovic, V. Borjanovic, M. Jaksic, Z. Pastuovic, J. M. Dutta,<br />

B. Vlahovic and R. J. Nemanich Vacuum 61, (2-4) 303-308, (2001).<br />

346. “Photon energy dependence <strong>of</strong> contrast in photoelectron emission microscopy <strong>of</strong> Si<br />

devices,” V. W. Ballarotto, K. Siegrist, R. J. Phaneuf, E. D. Williams, W. -C. Yang and R.<br />

J. Nemanich, Appl. Phys. Lett. 78, (22), 3547-3549, (2001).<br />

347. “UV-FEL Photo-Electron Emission Microscopy <strong>of</strong> the Dynamics <strong>of</strong> Nanostructures on<br />

Silicon Surfaces,” W. C. Yang, H. Ade and R. J. Nemanich. “Laser Applications in<br />

Microelectronic and Optoelectronic Manufacturing VI,” Edited by M. C. Gower, H.<br />

Helvajian, K. Sugioka and J. J. Dubowski. (SPIE, Bellingham, WA, 2001) SPIE Vol. 4274,<br />

168-176, (2001).<br />

348. “Thermionic FEEM, PEEM and I/V Measurements <strong>of</strong> Hydrogen Terminated N-Doped<br />

CVD Diamond Surfaces,” F. A. M. Koeck, J. M. Garguilo, B. Brown and R. J. Nemanich.<br />

Proceedings <strong>of</strong> Sixth Applied Diamond Conference/Second Frontier Carbon Technology<br />

Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. Yoshikawa, M. Murakawa, Y.<br />

Koga, K. Kobashi and G. A. J. Amaratunga, 126-131, (2001).<br />

349. “Field Emission, PEEM and FEEM Measurements <strong>of</strong> Emitting Sites <strong>of</strong> MPCVD grown<br />

NanoCrystalline diamond Films,” J. M. Garguilo, F. A. M. Koeck, Billyde Brown and R. J.<br />

Nemanich, Proceedings <strong>of</strong> Sixth Applied Diamond Conference/Second Frontier Carbon<br />

Technology Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M. Yoshikawa, M.<br />

Murakawa, Y. Koga, K. Kobashi and G. A. J. Amaratunga, 133-137, (2001).<br />

350. “High-Pressure Polymerization <strong>of</strong> Single Wall Carbon Nanotubes,” M. Popov, M. Kyotani,<br />

Y. Koga and R. J. Nemanich, Proceedings <strong>of</strong> Sixth Applied Diamond Conference/Second<br />

Frontier Carbon Technology Joint Conference, Edited by Y. Tzeng, K. Miyoshi, M.<br />

Yoshikawa, M. Murakawa, Y. Koga, K. Kobashi and G. A. J. Amaratunga, 681-686,<br />

(2001).<br />

351. “Phonons in III-V nitrides: Confined phonons and interface phonons,” M. Dutta, D.<br />

Alexson, L. Bergman, R. J. Nemanich, R. Dupuis, K. W. Kiim, S. Komirenko, and M.<br />

Stroscio, Physica. E 11, (Low-dimensional systems and nanostructures) 277-280 (2001).<br />

352. “Measurements <strong>of</strong> the Band Offset <strong>of</strong> SiO2 on Clean GaN,” E. H. Hurt, T. E. Cook, Jr., K.<br />

M. Tracy, R. F. Davis, G. Lucovsky and R. J. Nemanich GaN and Related Alloys edited by<br />

J.E. Northrup, J. Neugebauer, D.C. Look, S.F. Chichibu, H. Riechert (Mater. Res. Soc.<br />

Proc. Vol. 693, p. I9.10) Boston, MA, 2001).<br />

48

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