biographical summary of robert j. nemanich - Department of Physics ...

Ade and R. F. Davis. Applied Surface Science 130-132, 694-703 (1998). Proceedings of
The Fourth International Symposium on Atomically Controlled Surfaces and Interfaces.
285. “Dependence of (0001) GaN/AlN valence band discontinuity on growth temperature and
surface reconstruction,” S. W. King, C. Ronning, R. F. Davis, M. C. Benjamin and R. J.
Nemanich, J. Appl. Phys. 84, (4), 2086-2090 (1998).
286. “Co-deposition of Cobalt Disilicide on Silicon-Germanium Thin Films,” P. T. Goeller, B. I.
Boyanov, D. E. Sayers and R. J. Nemanich, Presented at Conference on Multigrid Coatings
and Thin Films, San Diego, CA, April 21-25, 1997. Thin Solid Films 320, 206-210 (1998).
287. “Surface Cleaning, Electronic States and Electron Affinity of Diamond (100), (111) and
(110) Surfaces,” P. K. Baumann and R. J. Nemanich, Surface Science 409, 320-335
(1998).
288. “In situ studies of metal-semiconductor interactions with synchrotron radiaiton,” D. E.
Sayers, P. T. Goeller, B. I. Boyanov and R. J. Nemanich, J. Synchrotron Rad. 5, 1050-
1051, (1998)
289. “Structural and electronic properties of boron nitride thin films containing silicon,” C.
Ronning, A. D. Banks, B. L. McCarson, R. Schlesser, Z. Sitar, R. F. Davis, B. L. Ward and
R. J. Nemanich. J. Appl. Phys. 84, (9), 5046-5051, (1998).
290. “Cleaning of AlN and GaN Surfaces,” S. W. King, J. P. Barnak, M. D. Bremser, K. M.
Tracy, C. Ronning, R. F. Davis, and R. J. Nemanich. J. Appl. Phys. 84, (9), 5248-5260
(1998).
291. “Electron Emission Characteristics of GaN Pyramid Arrays Grown via Organommetallic
Vapor Phase Epitaxy,” B. L. Ward, O. -H. Nam, J. D. Hartman, S. L. English, B. L.
McCarson, R. Schlesser, Z. Sitar, R. F. Davis and R. J. Nemanich. J. Appl Phys. 84, (9),
5238-5242 (1998).
292. “X-ray Photoelectron Diffraction from (3x3) and (√3x√3) R30° (0001)Si 6H-SiC
Surfaces,” S. W. King, C. Ronning, R. F. Davis, R. S. Busby and R. J. Nemanich. J. Appl.
Phys. 84, (11), 6042-6048, (1998).
293. “Piezoelectric measurements with atomic force microscopy,” J. A. Christman, R. R.
Woolcott, Jr., A. I. Kingon, and R. J. Nemanich, Appl. Phys. Lett., 73, (26), 3851-3853
(1998).
294. “A Free Electron Laser - Photoemission Electron Microscope System (FEL-PEEM),” H.
Ade, W. Yang, S. L. English, J. Hartman, R. F. Davis, R. J. Nemanich, V. N. Litvinenko,
I. V. Pinayev, Y. Wu and J. M. J. Madey. Surface Review and Letters 5, (6) 1257-1268
(1998).
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