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biographical summary of robert j. nemanich - Department of Physics ...

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353. “Measurements <strong>of</strong> the Effective Piezoelectric Constant <strong>of</strong> Nitride Thin Films and<br />

Heterostructures using Scanning Force Microscopy,” B. J. Rodriguez, D-J. Kim, A.I.<br />

Kingon and R.J. Nemanich, GaN and Related Alloys, edited by J.E. Northrup, J.<br />

Neugebauer, S.F. Chichibu, D.C. Look and H. Riechert. (Mater. Res. Soc. Proc. Vol. 693,<br />

p.I9.9.1) Boston, MA, 2001.<br />

354. “Chemical, Electrical, and Structural Properties <strong>of</strong> Ni/Au Contacts on Chemical Vapor<br />

Cleaned p-typed GaN,” P.J. Hartlieb, A. Roskowski, R.F. Davis and R.J. Nemanich. GaN<br />

and Related Alloys, edited by J.E. Northrup, J. Neugebauer, S.F. Chichibu, D.C. Look and<br />

H. Riechert (Mater. Res. Soc. Proc. Vol. 693, p. I11.40.1) Boston, MA, 2001.<br />

355. “Growth <strong>of</strong> epitaxial CoSi2 on 6H-SiC (0001) Si,” W. Platow, R. J. Nemanich, D. E. Sayers,<br />

J. D. Hartman and R. F. Davis, J. Appl. Phys. 90, (12), 5924-5927 (2001).<br />

356. “Imaging electron emission from diamond films surfaces: N-doped diamond vs.<br />

nanostructured diamond,” F. A. M. Koeck, J. M. Garguilo and R. J. Nemanich, Diamond<br />

and Related Materials 10, 1714-1718 (2001).<br />

357. “Selective bond breaking in amorphous hydrogenated silicon by using Duke FEL,” D. Gr<br />

acin, V. Borjanovic, B. Valhovic, A. Sunda-Meya, T. M. Patterson, J. M. Dutta, S. Hauger,<br />

I. Pinayev, M. E. Ware, D. Alexson, R. J. Nemanich and B. von Roedern Nuclear<br />

Instruments & Methods in <strong>Physics</strong> Research. Section A, Accelerators, Spectrometers,<br />

Detectors and Associated Equipment 475(1-3), 635-639 (2001).<br />

2002<br />

358. “Pd growth and subsequent Schottky barrier formation on chemnical vapor cleaned p-type<br />

GaN Surface,” P. J. Hartlieb, A. Roskowski, R. F. Davis, W. Platow and R. J. Nemanich. J.<br />

Appl. Phys. 91, (2), 732-738 (2002).<br />

359. “Electrical, Structural and Microstructural Characteristics <strong>of</strong> As-Deposited and Annealed<br />

Pt and Au Contacts on Chemical-Vapor-Cleaned GaN Thin Films,” E.A. Preble, K.M.<br />

Tracy, S. Kiesel, H. McLean, P.Q. Miraglia, R.J. Nemanich, R.F. Davis, M. Albrecht and<br />

David J. Smith, J Appl. Phys. 91, (4), 2133-2137 (2002).<br />

360. “Superhard Phase Composed <strong>of</strong> Single-wall Carbon Nanotubes,” M. Popov, M. Kyotani,<br />

R. J. Nemanich and Y. Koga, Phys. Rev. B 65 (3), art.no. 033408 (2002).<br />

361. “Chemical, Electrical, and Structural Properties <strong>of</strong> Ni/Au Contacts on Chemical Vapor<br />

Cleaned p-typed GaN,” P.J. Hartlieb, A. Roskowski, R.F. Davis and R.J. Nemanich, J.<br />

Appl. Phy. 91, (11), 9151-9160. (2002)<br />

362. “Piezoresponse force microscopy for polarity imaging <strong>of</strong> GaN,” B.J. Rodriguez, A.<br />

Gruverman, A.L. Kingon, R.J. Nemanich, O. Ambacher. Appl. Phys. Lett. 80 (22), 4166-<br />

4168 (2002).<br />

49

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