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Overview in PDF format - Tallinna Tehnikaülikool

Overview in PDF format - Tallinna Tehnikaülikool

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correct<strong>in</strong>g image distortions <strong>in</strong> optical, electrical and digital parts of the measur<strong>in</strong>gsystem.In bitmap images each pixel is treated <strong>in</strong>dividually. For image recognition andmeasurement, it is important to know relations between different pixels. The firststep <strong>in</strong> this direction is an analysis of the small neighbourhood of each pixel.Program Terik uses two neighbourhood operators: non-l<strong>in</strong>ear median filter forremov<strong>in</strong>g noise, and a variation of Roberts filter for edge detect<strong>in</strong>g. For fasterimage comput<strong>in</strong>g and deselect<strong>in</strong>g non-<strong>in</strong>terest<strong>in</strong>g areas only a part of picture can beselected for image manipulation. All results can be saved <strong>in</strong>to <strong>format</strong>ted text filesfor future analyz<strong>in</strong>g <strong>in</strong> other programs (MS Excel, etc). Experimentally themeasurement time was reduced from 90 m<strong>in</strong> (by conventional microscope) to 3 m<strong>in</strong>(by us<strong>in</strong>g video measurement system). In Fig. 2.7 a screenshot is shown of theprogram Terik work<strong>in</strong>g w<strong>in</strong>dow, written <strong>in</strong> Visual Basic.Figure 2.7 Work<strong>in</strong>g w<strong>in</strong>dows of the image process<strong>in</strong>g program TerikA smooth, uniform illum<strong>in</strong>ation system is the most important factor <strong>in</strong>fluenc<strong>in</strong>gmach<strong>in</strong>e vision (Tervola, 2001), therefore a cold light source with preferablygooseneck fibre optics is essential. Variations <strong>in</strong> radiation affect the image<strong>format</strong>ion system, thus caus<strong>in</strong>g difficulties <strong>in</strong> boundary detection. As the authors’experience shows, the unstable illum<strong>in</strong>ation direction can <strong>in</strong>fluence themeasurement results about 10 %. The problem arises <strong>in</strong> IMS due to chip flow<strong>in</strong>fluences.The Terik solution has been successfully used <strong>in</strong> several <strong>in</strong>dustrial researches,e.g. to reduce burr<strong>in</strong>g <strong>in</strong> mill<strong>in</strong>g PLC plates for electronic <strong>in</strong>dustry, and to estimatethe <strong>in</strong>fluence of counter-clockwise and clockwise mill<strong>in</strong>g on burr <strong>format</strong>ion.22

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