ARCHIVE 2009 - BiTS Workshop
ARCHIVE 2009 - BiTS Workshop
ARCHIVE 2009 - BiTS Workshop
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<strong>2009</strong>Session 3Adventures in Test & Burn-in OperationsCID Process OverviewYield, CRES, CONT,Usage, PerformanceAnalysis, etc.Load BoardContactorsTestWare DBKEYTablesProduct/Test Engr.Shared MemoryContactor Management/Tracking,spares, insertion modeling,maintenance, repair, etc.IC TESTERC-Shop DBRTM (Real Time Monitor) ToolsCID, Site-to-Site, Yield, etc.3/<strong>2009</strong> CID: A New Breakthrough Solution for Contactor Hardware Tracking 15CID Insertion Modeling - Results• Could lead to High Re-screen/Mistest• Can affect measurements that will lead to intermittent or false failuresThe CID will accurately model this data and provide efficiency onour preventive maintenance scheduling3/<strong>2009</strong> CID: A New Breakthrough Solution for Contactor Hardware Tracking 16Paper #2March 8 - 11, <strong>2009</strong>8