ARCHIVE 2009 - BiTS Workshop

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2009Session 3Adventures in Test & Burn-in OperationsCID Process OverviewYield, CRES, CONT,Usage, PerformanceAnalysis, etc.Load BoardContactorsTestWare DBKEYTablesProduct/Test Engr.Shared MemoryContactor Management/Tracking,spares, insertion modeling,maintenance, repair, etc.IC TESTERC-Shop DBRTM (Real Time Monitor) ToolsCID, Site-to-Site, Yield, etc.3/2009 CID: A New Breakthrough Solution for Contactor Hardware Tracking 15CID Insertion Modeling - Results• Could lead to High Re-screen/Mistest• Can affect measurements that will lead to intermittent or false failuresThe CID will accurately model this data and provide efficiency onour preventive maintenance scheduling3/2009 CID: A New Breakthrough Solution for Contactor Hardware Tracking 16Paper #2March 8 - 11, 20098
2009Session 3Adventures in Test & Burn-in OperationsConclusion The CID is an intelligent and cost effective solution toimprove the way we track contactors automatically The CID addresses the need for accurate usagerecords by associating “Unit Level” data with thecontactor being used The CID can be implemented at TI without the needfor high investment or new system infrastructure The CID had been proven to work on DSPS devices3/2009 CID: A New Breakthrough Solution for Contactor Hardware Tracking 17Business Impact COST Better Management of Spares and Peripheral Align Capacity planning = Reduce Capital Expenditures CYCLE TIME Accurate Preventive Maintenance Scheduling = ReduceDowntime More output = On Time Delivery (OTD) YIELD IMPROVEMENTS EFFICIENCY3/2009 CID: A New Breakthrough Solution for Contactor Hardware Tracking 18Paper #2March 8 - 11, 20099
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ARCHIVE 2009 - BiTS Workshop

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