ARCHIVE 2009 - BiTS Workshop

2009Session 3Adventures in Test & Burn-in OperationsMechanical Reliability Test• Luu Nguyen’s team at NSC have shownthat power cycle test can be used and is 10xfaster compared to thermal cycling test• Integrated as a part of test socket,• Stand-alone power cycle system, with manysamples at a time3/2009 Mechanical Reliability Test as Part of Final Test of a Packaged Chip 3Power Cycle vs. Thermal Cycle• Accelerated Temperature Cycling (ATC)– Most widely used accelerated life test– Sample is placed inside test chamber and chamber iscycled between extreme temperatures– Time consuming because of the time the chamber needsto reach test temperature• Power cycling test– Heat is generated by powered electronic device– More representative of field conditions, becausepackage is heated differentially– Typical cycle is faster than in thermal cycling3/2009 Mechanical Reliability Test as Part of Final Test of a Packaged Chip 4Paper #3March 8 - 11, 20092