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Jens Janssen Diploma Thesis - Prof. Dr. Norbert Wermes ...

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e accessed through a 20-bit wide address bus. The overall maximum readoutspeed reaches 1 /4 of the raw data speed of the USB 2.0 Hi-Speed interface(approximately 15 MB/s).Various input/output (I/O) connectors can be accessed by the FPGA. Themain I/O connector (100-pin connector) is placed on the edge of the S3Multi-IO-Board and can hold di erent types of adapter cards. In addition, thereare various other multi-purpose I/O ports available. Six LEMO connectors, an8P8C 5 jack, a 100-pin Samtec connector and a 16 pin header are placed on theS3Multi-IO-Board.4.3.2 Single Module Adapter CardThe Single Module Adapter Card (SMAC, Rev. 1.2) holds low-voltage di erentialsignaling (LVDS) transceiver to enable high-speed data transmission overstandard flat ribbon cable. The flat ribbon cable connects the SMAC to theSingle Chip Card (see next section). Additionally, analog voltage (AVDD), digitalvoltage (DVDD) and low voltage (LVDD), which are needed for the SingleChip Card (see section 4.3.3), are transmitted over the flat ribbon cable. Thesupply voltages are received from external power supplies which are connectedto the 8-pin Molex power connector. The SMAC also holds an analog-to-digitalconverter (ADC) which is connected to the microcontroller over the I Cbus.The ADC reads out AVDD and DVDD, and a negative temperature coe cient(NTC) thermistor which can be soldered to the Single Chip Card.4.3.3 Single Chip CardThe Single Chip Card (SCC) holds the FE-I3 chip which receives AVDD andDVDD from the SMAC. LVDS transceivers are placed on the SCC to convertincoming LVDS signals to single-ended CMOS and vice versa. The transceiverscan either be powered by using LVDD (2.8V) from the SMAC or externally byconnecting a power supply to a LEMO connector. Another LEMO connectorcan be connected to a high voltage power supply and receives bias voltage forbiasing the sensor. Two more LEMO connectors are available which providesaccess to the MonAmp and VCal pad on the FE-I3 chip.Several test pads are available for testing and measuring signal integrity ofthe FE-I3 readout chip. Some of them are needed during chip/sensor characterization(see section 5.4).4.4 Software Framework of USBpixThe software framework of USBpix has a multi-layer structure which reflectsthe hardware structure of the test system. It encapsulates functionality withinuseable objects which creates function modules. In the following sections, acloser look will be given on the USBpix framework. The focus is on changeswhich have made during this thesis.5 8P8C jacks are often referred to as “RJ-45” jacks.36

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