Jens Janssen Diploma Thesis - Prof. Dr. Norbert Wermes ...

More documents

Recommendations

Info

Figure C.1: Tuning of the 3631-303 “ATLAS” detector. (a) Threshold Scan: Mean threshold and threshold distribution. (b) ThresholdScan: Mean noise and noise distribution. (c) ToT Verification Scan: Mean ToT and ToT distribution at 20, 000 e ≠ .(a)(b)(c)3400335033003250320031503100305030000 500 1000 1500 2000 2500"Channel" = row+160*column+2880*chip5004504003503002502001500 500 1000 1500 2000 2500"Channel" = row+160*column+2880*chip0 500 1000 1500 2000 2500"Channel" = row+160*column+2880*chip24262830323436150 200 250 300 350 400 450 5003000 3050 3100 3150 3200 3250 3300 3350 3400141210864222020018016014012010080604020Constant 13.26Mean 375.8Sigma 22.99Constant 18.382018Mean 20616Sigma 13.041412108642150 200 250 300 350 400 450 5003824 26 28 30 32 34 36 3850100gangedinter-ganged150150 200 250 300 350 400 450 500150 200 250 300 350 400 450 50020010020250Constant 210.8Mean 3208Sigma 21.49200403006030080Constant 314.6Mean 29.86Sigma 0.570800 2 4 6 8 10 12 14 16Column3000500 Constant 466.9Mean 180400Sigma 7.287100Constant 111.7Mean 221.6Sigma 7.56300 2 4 6 8 10 12 14 16Column203050long20244031000 2 4 6 8 10 12 14 16Column4026Row1401201008060315032003250330033503400Row140120100806040200150200250300350400450Row1401201008060283032343638500SCURVE_MEAN: THRESHOLD_SCAN.Module "ATLAS_7A"Threshold mod 0 chip 0Module "ATLAS_7A"Noise mod 0 chip 0Module "ATLAS_7A"ToTMean mod 0 bin 0 chip 0SCURVE_SIGMA: THRESHOLD_SCAN.TOT_MEAN: TOT_VERIF.84
SCURVE_MEAN: THRESHOLD_SCAN 2.SCURVE_SIGMA: THRESHOLD_SCAN 2.TOT_MEAN: TOT_VERIF 1.Module "CIS_W11"Threshold mod 0 chip 0140Row12010080604020020018016014012010080604020340033503300325032003150310030500 2 4 6 8 10 12 14 16Column340033503300325032003150310030503000Constant 203.9Mean 3197Sigma 22.243000 3050 3100 3150 3200 3250 3300 3350 340030000 500 1000 1500 2000 2500"Channel" = row+160*column+2880*chipModule "CIS_W11"Noise mod 0 chip 0140Row120100806040200 2 4 6 8 10 12 14 16Column200 Constant 185.8180Mean 191.3160Sigma 7.58414012010080604020ganged1210160 180 200 220 240 260 280 300Constant 6.114Mean 208Sigma 26160 180 200 220 240 260 280 300300280260240220200180160long5040302010300280260240220200180160Constant 44.69Mean 227.8Sigma 7.836160 180 200 220 240 260 280 300inter-gangedConstant 8.046Mean 195.5Sigma 8.183160 180 200 220 240 260 280 300"Channel" = row+160*column+2880*chip0 500 1000 1500 2000 2500Module "CIS_W11"ToTMean mod 0 bin 0 chip 01400 2 4 6 8 10 12 14 16Column(a)(b)86420987654321Row120100806040200500400300200100454035302520454035302520Constant 513.2Mean 29.85Sigma 0.645320 25 30 35 40 450 500 1000 1500 2000 2500"Channel" = row+160*column+2880*chip(c)Figure C.2: Tuning of the W11 19GR-2 detector. (a) Threshold Scan: Mean threshold and threshold distribution. (b) Threshold Scan:Mean noise and noise distribution. (c) ToT Verification Scan: Mean ToT and ToT distribution at 20, 000 e ≠ .85
Page 1:
Universität BonnPhysikalisches Ins
Page 7 and 8:
Chapter 1IntroductionThe ATLAS expe
Page 9 and 10:
Chapter 2The LHC Experiment2.1 The
Page 11 and 12:
Figure 2.3: Cut-away view of the in
Page 13 and 14:
The electromagnetic calorimeter use
Page 15 and 16:
Chapter 3Silicon Pixel Detectors3.1
Page 17 and 18:
Figure 3.2: Layout and interconnect
Page 19 and 20:
(a) (b)Figure 3.4: On top view of t
Page 21:
Figure 3.5: The analog pixel block
Page 24 and 25:
Figure 3.8: The digital block of th
Page 26 and 27:
the digital readout of the chip can
Page 28 and 29:
Stopping power [MeV cm 2 /g]100101L
Page 30 and 31:
The free charge carriers need to be
Page 32 and 33:
The first point particularly concer
Page 34 and 35:
Figure 3.14: A 3D n-in-p sensor (le
Page 36 and 37:
few µm compared to a few 100 µm).
Page 38 and 39: Figure 4.1: The USBpix test system
Page 40 and 41: e accessed through a 20-bit wide ad
Page 42 and 43: hardware, USBpixdll library uses fu
Page 44 and 45: 100Scan overlaythreshold80604020MSC
Page 46 and 47: mand clock (CCK, 4 MHz 17 ) by mult
Page 48 and 49: aw data word bit [31:0]hit wordw/o
Page 50 and 51: Figure 4.7: Overview of interconnec
Page 52 and 53: SOURCE_SCAN.Module "test"Cluster To
Page 54 and 55: Figure 5.1: The USBpix test setup:
Page 56 and 57: Not only the wafer processing a ect
Page 58 and 59: 2. The tuning was changed to a gain
Page 60 and 61: FDAC The FDAC is a 3-bit pixel regi
Page 62 and 63: probability of 50%. Mathematically,
Page 64 and 65: that the particles first impinge th
Page 66 and 67: 2. Conversion of (clustered) Time-o
Page 68 and 69: from the expected charge of 10000 e
Page 70 and 71: 6.2 Unirradiated Planar SensorsThe
Page 72 and 73: Sensor 3631-303 “ATLAS W11 19GR-2
Page 74 and 75: (a)(b)(c)Figure 6.4: Planar devices
Page 76 and 77: 6.3.1 Results of the Bias ScanLeaka
Page 78 and 79: (a)(b)Figure 6.7: Leakage current o
Page 80 and 81: (a)(b)Figure 6.9: FBK 3D devices: m
Page 82 and 83: Appendix AFE-I3 StandardConfigurati
Page 84 and 85: Appendix BFPGA ConfigurationRegiste
Page 86 and 87: Appendix CTuning ResultsThis page i
Page 90 and 91: 8642Figure C.3: Tuning of the WR13
Page 92 and 93: 8642Figure C.5: Tuning of the 4EM9
Page 94 and 95: [13] Peric, I. et al.: The FEI3 rea
Page 96 and 97: [37] Backhaus, M. et al.: Developme
show all

Jens Janssen Diploma Thesis - Prof. Dr. Norbert Wermes ...

Create successful ePaper yourself

Delete template?

Save as template?