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SPIRE Design Description - Research Services

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Draft <strong>SPIRE</strong> <strong>Design</strong> <strong>Description</strong> Document<br />

System <strong>Description</strong>/Issues Sub-systems <strong>Design</strong><br />

analysis<br />

Instrument<br />

control and<br />

communicat<br />

ion<br />

Instrument<br />

data<br />

processing<br />

To ensure that the <strong>SPIRE</strong> instrument<br />

communicates with the Herschel<br />

system; that the different parts of the<br />

<strong>SPIRE</strong> instrument are mutually<br />

consistent with the operations concept<br />

and that the instrument operates safely<br />

and to requirements in all operational<br />

modes<br />

Data interface to Herschel system<br />

Operating mode definition<br />

Instrument commanding definition<br />

On board software definition<br />

Sub-system operational and control<br />

interfaces<br />

Sub-system data interfaces<br />

To ensure that the data produced by<br />

the <strong>SPIRE</strong> instrument are compatible<br />

with the requirements of the Herschel<br />

system and are processed into the<br />

required data products<br />

Interfaces to the ICC<br />

Data product definition<br />

Data processing definition<br />

Sub-system data processing interfaces<br />

Observing mode data processing<br />

interfaces<br />

30<br />

DRCU<br />

(FSDRC)<br />

<strong>SPIRE</strong> warm<br />

harness<br />

(FSWIH)<br />

DPU (FSDPU)<br />

S/C CDMS<br />

FPU Simulator<br />

DRCU<br />

Simulator<br />

DPU (FSDPU)<br />

DRCU<br />

Simulator<br />

FPU Simulator<br />

ICC<br />

Tools<br />

Systems<br />

analysis<br />

Software<br />

simulators<br />

Systems<br />

analysis<br />

Software<br />

simulators<br />

<strong>Design</strong><br />

verification<br />

methods<br />

EM and QM<br />

electronics units<br />

tested as subsystem<br />

with<br />

simulator(s)<br />

CQM Instrument<br />

level testing<br />

AVM and CQM<br />

system level<br />

testing<br />

Data sets<br />

produced by<br />

simulators EM<br />

and QM<br />

electronics units<br />

tested as subsystem<br />

with<br />

simulator(s)<br />

produces data sets<br />

Instrument level<br />

CQM tests for<br />

observation<br />

verification and<br />

producing data<br />

sets<br />

System level<br />

AVM and CQM<br />

tests for end to<br />

end verification

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