Practice of Kinetics (Comprehensive Chemical Kinetics, Volume 1)

INDEX 429£Echol's vacuum tap, 7effectiveness factor, for diffusion in porouscatalyst, 228-231effusion gauge, to determine atom concentrations,327electrical double layer, at surface of semiconductor,213electric field, and radiolysis, 64electrocapillarity, in study of adsorption fromsolution, 250electrochemical methods, for fast reactions,115, 116, 157-162electrode assembly, for space charge limiteddiode, 204—, for thermionic emission, 201electrodeless discharge, in Hg lamps, 41electrode potential, and half-wave potential,159electrodes, for determination of ions in flames,328, 329—, for determination of surface potential, 268,269—, for polarography, 158—, for T-jump cell, 134—, —» polarisation at, 136—, for vibration condenser method, 206, 207electrometer, to measure photocurrent, 201—, with Wheatstone network, 212electron bombardment, for cleaning surfaces,183—, for giving films, 184—, for giving ions, 284—, —, in mass spectrometry, 295—, to determine oscillator strengths of radicals,291—, to give trapped radicals, 332 -electron diffraction, low energy, for study ofadsorption, 216electron emission, for cleaning surfaces, 182electronically excited species, see excited specieselectron microscopy, for study of solid statereactions, 255electron paramagnetic resonance, see electronspin resonanceelectrons, determination of collision crosssections,330—, determination of in flames, 329,330—, hydrated, production and properties, 122,123—, in field emission, 202, 204—, in pulse radiolysis, 121—, in radiolysis, 64—» —» production of, 65, 67—, —, range of, 66—, photoemission of, 62—, traps for, 6, 70—, unpaired and magnetic susceptibility, 208electron spin resonance, 91, 149-152, 308-314—, and concentration measurements in flames,171—, and flow method, 164—, and solid state reactions, 261—, and study of adsorption, 210, 211—, theory of, 149, 210, 308, 309—, to detect unstable states of metals, 283electron transfer, and chemisorption, 181—, and fluorescence quenching, 153elementary reaction, and "simple" reaction,400Elovich equation, 189emission, of NO in N+O a reaction, 167emission regulator, for omegatron, 241, 242emission spectra, of Hg vapour lamps, 45—, of Kr and Xe lamps, 54emission spectroscopy, and determination ofintermediates, 286-290encounter complex, in fluorescence quenching,153, 154endothermic reactions, temperature gradientsin, 11energy, and ion-pair formation, 68—, distribution of in Hg lamp emission, 43—, equilibration of in flames, 169—, of particles in radiolysis, 65—, of reactants and products in crossed molecularbeam, 174, 175—, recoil, and hot atom production, 67energy absorption coefficient, and sound wavepropagation, 139energy conservation equation, and flames, 169energy transfer, 16, 17—, and low pressure flow system, 25—, and photochemistry, 35—, efficiency of, 17—, in radiolysis, 70enthalpies of reaction, and activation energies,3, 4—, and differential calorimetry, 100, 101—, and dosimetry, 68—, and flow systems, 166—, and relaxation methods, 133, 135—, and shock tube studies, 127—, and thermal gradients in vessels, 11, 12—, and T-jump, 136, 137—, and ultrasonic absorption, 139—, in solid state from thermograms, 260—, of CH 3 -f halogens and H halides, 74—, of 0+H a O, 322