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Inorganic Microporous Membranes for Gas Separation in Fossil Fuel ...

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4 Results and discussion<br />

A) 8YSZ membrane<br />

Excitation: 514.5 nm; 20.6 mW<br />

Raman Intensity<br />

Al 2 O 3<br />

380<br />

cubic YSZ<br />

262<br />

400 380 360 340 320 300 280 260 240 220 200<br />

Wavenumber/cm -1<br />

cubic YSZ<br />

225<br />

98<br />

Raman Intensity<br />

Al-O-Zr<br />

1155<br />

B) 8YSZ membrane<br />

Excitation: 514.5 nm; 20.6 mW<br />

cubic YSZ<br />

1050<br />

cubic YSZ<br />

1033<br />

1200 1180 1160 1140 1120 1100 1080 1060 1040 1020<br />

Wavenumber/cm -1<br />

Figure 65 A and B Raman spectra of the 8YSZ layer that conta<strong>in</strong>ed F127, acetyl acetone and caproic acid<br />

<strong>in</strong> the sol.<br />

4.3.3.2 Am<strong>in</strong>e approach - TiO2-ZrO2 and b<strong>in</strong>ary oxide layers<br />

TiO2, ZrO2 and 50 mol % TiO2 <strong>in</strong> ZrO2 layers are prepared on γ-Al2O3 membranes. The<br />

films are prepared by sp<strong>in</strong> or dip coat<strong>in</strong>g us<strong>in</strong>g the as-made DEA sols. The amount of<br />

mesoporous defects <strong>in</strong> the f<strong>in</strong>al membrane layer was m<strong>in</strong>imised by consequently coat<strong>in</strong>g<br />

each γ-Al2O3 membrane twice with the DEA sol. The first DEA layer was calc<strong>in</strong>ed<br />

be<strong>for</strong>e apply<strong>in</strong>g the second DEA layer. The layer thickness of the <strong>in</strong>termediate layer and<br />

the f<strong>in</strong>al membrane layer is observed with SEM and TEM. 20-40 nm homogeneous th<strong>in</strong><br />

films have been observed <strong>for</strong> the membrane layers prepared from TiO2, ZrO2 and<br />

Ti0.5Zr0.5O2 calc<strong>in</strong>ed at 400, 500 and 600ºC (Table 27 and Figure 67 A-C).<br />

The <strong>in</strong>filtration depth of DEA sols was studied by means of Secondary Ion Mass<br />

Spectroscopy (SIMS). A penetration depth <strong>in</strong>to the γ-Al2O3 was approximately half the<br />

f<strong>in</strong>al membrane layer thickness, consider<strong>in</strong>g the TiO2, ZrO2 and Ti0.5Zr0.5O2 layers<br />

calc<strong>in</strong>ed at 500ºC. Titanium and zirconium atoms were found at a distance of 10-15 nm<br />

from the Ti0.5Zr0.5O2 – γ-Al2O3 boundary <strong>for</strong> the Ti0.5Zr0.5O2 membrane with a thickness<br />

of 25 nm.<br />

Table 27 Intermediate and f<strong>in</strong>al membrane layer thickness<br />

Calc<strong>in</strong>ation mol% Ti Thickness γ-Al2O3 <strong>in</strong> µm Thickness F<strong>in</strong>al layer <strong>in</strong><br />

temperature<br />

nm by TEM<br />

400ºC 50 2.5 20-30 (SEM)<br />

0 5.8 36<br />

500ºC 50 2.6 25<br />

100 2.4 22<br />

600ºC 50 4.5 23

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