Quality and Reliability Methods - SAS

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252 Lifetime Distribution II Chapter 14 Navigating the Fit Life by X Report Window The Nested Model Tests include statistics and diagnostic plots for the Separate Location and Scale, Separate Location, Regression, and No Effect models. To see results for each of the models (independently of the other models), click the underlined model of interest (listed under the Nested Model Tests outline title) and then uncheck the check boxes for the other models. Nested models are described in Table 14.2. Separate Location and Scale, Separate Location, Regression, and No Effect models, using a Weibull distribution for Devalt.jmp, are shown in Figure 14.14, Figure 14.15, Figure 14.16, and Figure 14.17, respectively. Table 14.2 Nested Models Nested Models Description Example Separate Location and Scale Separate Location Regression No Effect Assumes that the location and scale parameters are different for all levels of the explanatory variable and is equivalent to fitting the distribution by the levels of the explanatory variable. The Separate Location and Scale Model has multiple location parameters and multiple scale parameters. Assumes that the location parameters are different, but the scale parameters are the same for all levels of the explanatory variable. The Separate Location Model has multiple location parameters and only one scale parameter. Is the default model shown in the initial Fit Life by X report window. Assumes that the explanatory variable does not affect the response and is equivalent to fitting all of the data values to the selected distribution. The No Effect Model has one location parameter and one scale parameter. Figure 14.14 Figure 14.15 Figure 14.16 Figure 14.17
Chapter 14 Lifetime Distribution II 253 Navigating the Fit Life by X Report Window Figure 14.14 Separate Location and Scale Model with the Weibull Distribution for Devalt.jmp Data
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Version 10 Quality and Reliability
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INDIRECT OR CONSEQUENTIAL DAMAGES O
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Chapter 11 Pareto Plots 181 Pareto
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Chapter 11 Pareto Plots 193 Defect
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Chapter 19 Reliability and Survival
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References Abernethy, Robert B. (19
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References 407 Carroll, R.J., Ruppe
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References 409 Haaland, P.D. (1989)
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References 411 Lawless, J.F. (1982)
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References 413 Nelson, W.B. (2003),
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References 415 Snee, R.D. and Marqu
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Index JMP Quality and Reliability M
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Index 419 Fit SEV 242 Fit Weibull 2
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Index 421 Q Quantiles table 356 R R
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Index 423 Weibull Plot 360 Westgard
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Quality and Reliability Methods - SAS

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