Quality and Reliability Methods - SAS

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380 Reliability and Survival Analysis II Chapter 20 Options and Reports Figure 20.7 Parametric Survival Model Reports See the section “Nonlinear Parametric Survival Models” on page 394, for additional details on the statistical model. Example: Arrhenius Accelerated Failure Log-Normal Model The Devalt.jmp data set (also known as the Device A data) is described by Meeker and Escobar (1998, p. 493) as originating from Hooper and Amster (1990). The data set is found in the Reliability sample data folder. A partial listing of the data set is in Figure 20.8.
Chapter 20 Reliability and Survival Analysis II 381 Options and Reports Figure 20.8 Devalt Data Table Units are stressed by heating in order to make them fail soon enough to obtain enough failures to fit the distribution. Use the Bivariate platform to see a plot of hours by temperature using the log scale for time. See Meeker and Escobar (1998, fig. 19.1). To do so, select Analyze > Fit Y by X. Assign Hours to Y, Response and Temp to X, Factor. You can also run the Bivariate script on the left side of the data table.
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Quality and Reliability Methods - SAS

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