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Complete Report - University of New South Wales

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4.6.5 Improved SOI LEDs Using Surface Plasmons.<br />

A very effective way to enhance the external luminescence quantum effi ciency from silicon light<br />

emitting diodes is the application <strong>of</strong> light trapping schemes. Light trapping is conventionally<br />

used in photovoltaic devices to increase the average optical path for incident light, resulting<br />

in better absorption <strong>of</strong> weakly absorbed light. According to Kirchh<strong>of</strong>f’s law, an enhanced<br />

absorption corresponds to an enhanced emission. Light that is trapped within a planar device<br />

due to total internal refl ection can be coupled out after multiple paths through a textured<br />

device. The benefi cial effect <strong>of</strong> light trapping schemes on LED performance has been<br />

demonstrated in high effi ciency bulk silicon light emitting diodes [M.A. Green et al., Nature<br />

412, 805 (2001)].<br />

However, for thin silicon on insulator devices, traditional light trapping methods such as<br />

texturing with pyramids, cannot be used. The excitation <strong>of</strong> surface plasmons is a promising<br />

alternative way <strong>of</strong> increasing light absorption and emission from thin-Si based devices. An<br />

eighteen fold absorption enhancement at 800nm wavelength <strong>of</strong> silicon on insulator (SOI)<br />

devices was reported by Stuart and Hall [H.R. Stuart and D.G. Hall, Appl.Phys.Lett. 73, 3815<br />

(1998)]. Our work aims at increasing the absorption / emission form thin fi lm Si devices at<br />

longer wavelengths.<br />

Surface Plasmon effects are observed on thin silicon layers covered with an array <strong>of</strong><br />

nanometer sized metal islands deposited on the surface and separated from the active silicon<br />

layer by a very thin ( ~ 30nm) spacer layer (SiO2). A simple method <strong>of</strong> silver deposition followed<br />

by annealing is used to deposit Ag nanoparticles on silicon-on-insulator (SOI) light emitting<br />

devices. The fact that the entire island deposition is a low temperature process allows metal<br />

islands to be deposited onto fi nished fully processed devices. Fig.4.6.5.1 shows a typical SEM<br />

image <strong>of</strong> the nanometer sized silver islands.<br />

Figure 4.6.5.1: SEM photo <strong>of</strong> the deposited<br />

nanometre silver islands for the surface plasmon<br />

effect.<br />

Changes in the optical device performance were<br />

monitored experimentally by measuring the<br />

spectral electroluminescence (EL) emission and<br />

the spectral response (SR) <strong>of</strong> SOI LEDs before and<br />

after island deposition. The optical enhancement<br />

is calculated as the ratio <strong>of</strong> the SR and EL<br />

signals, respectively after and before deposition<br />

<strong>of</strong> the islands. This combination <strong>of</strong> EL and SR is<br />

ideal because it provides information about the<br />

optical path lengths enhancement in different<br />

spectral ranges above (SR) and near and below<br />

(EL) the band-gap <strong>of</strong> silicon. As reported earlier,<br />

our initial pro<strong>of</strong> <strong>of</strong> concept studies showed only<br />

a 30% enhancement in the electroluminescence<br />

measurements from our Silicon-on-insulator<br />

devices.<br />

105

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