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Complete Report - University of New South Wales

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system, microwave carrier lifetime system, ellipsometer, Sinton photoconductance lifetime<br />

equipment, wafer probing station for SOI LED work, open circuit voltage versus illumination<br />

measurement system (Suns-Voc), infrared microscope and equipment for spectral response<br />

and related optical measurements.<br />

In 2005 a new Fourier-transform infrared spectroscopy system (FTIR) was purchased for the<br />

laboratory along with a new 4 point resistivity probing station. Planning is also underway to<br />

provide additional effective workspace by removing the viewing wall partition and redesigning<br />

the associated work bench area.<br />

Optoelectronic Research Laboratory<br />

This facility has two optical benches and several visible and near-infrared semiconductor<br />

diode lasers along with other optical and electrical instrumentation. The facility is used for<br />

photoluminescence and electroluminescence measurements in the visible and infrared<br />

spectral range up to wavelengths <strong>of</strong> 2500nm, photoluminescence (PL) excitation spectroscopy,<br />

luminescence experiments with simultaneous two-colour illumination, quasi steady state<br />

photoluminescence lifetime measurements and Sinton lifetime testing with the conventional<br />

fl ash-light replaced by a high-power light emitting diode array. An area separate from the<br />

Device Characterisation Laboratory was necessary in order to meet stringent standards for<br />

avoidance <strong>of</strong> laser eye and skin exposure for users and others. It shares cryogenic cooling<br />

equipment with the Device Characterisation Laboratory.<br />

In 2005 the world’s fi rst photoluminescence imaging system was installed along with a<br />

silicon CCD camera (for sensitive PL measurements) and a second spectroscopic PL system.<br />

Demand for additional laboratory space for the Optoelectronic Research Laboratory has<br />

necessitated the conversion <strong>of</strong> adjacent lower ground fl oor <strong>of</strong>fi ce space into a future laser<br />

laboratory to accommodate experiments on an additional 4 optical benches.<br />

Figure 4.2.4: Optical characterisation bench.<br />

Thin-Film Cell Laboratory<br />

This 40 m2 laboratory is equipped with a range <strong>of</strong> equipment for thin-fi lm deposition and<br />

patterning, including a plasma-enhanced chemical vapour deposition (PECVD) system, a<br />

sputtering system, a reactive ion etcher (RIE), a resistively heated vacuum evaporator, and<br />

an optical microscope with digital image acquisition system. Also used by the laboratory is an<br />

electron-beam vacuum evaporator for silicon which is physically located within the Bulk Silicon<br />

Research Laboratory. This Si evaporator is also equipped with an ionizer unit and a sample<br />

heater, enabling fast-rate Si homoepitaxy at temperatures <strong>of</strong> about 500-600 °C by means <strong>of</strong><br />

ion-assisted deposition (IAD). Other equipment <strong>of</strong> use in thin-fi lm projects is located within the<br />

Semiconductor Nan<strong>of</strong>abrication Facility.<br />

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