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Low_resolution_Thesis_CDD_221009_public - Visual Optics and ...

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Acknowledgements<br />

Charlie Campbell, Bruce Drum, José Ramón Jiménez, Arthur Ho,<br />

Fabrice Manns, many anonymous reviewers <strong>and</strong> of course all the<br />

coathors of the different <strong>public</strong>ations (page 267) in which this thesis<br />

has resulted (Lourdes Llorente, Sergio Barbero, Daniel Cano, Jesús<br />

Merayo, Rosario G. Anera, Maria J. González, Laura Remón, Jan<br />

Siegel, Alfonso Pérez-Escudero), provided helpful suggestions,<br />

encouraged <strong>and</strong> supported this research. But this research was only<br />

possible thanks to Susana Marcos <strong>and</strong> in particular, her strong<br />

implication in this PhD project, her teaching skills <strong>and</strong> her<br />

impressive dedication to science.<br />

We acknowledge the generous dedication of the different<br />

volunteer subjects participating in the experiments. Support from<br />

IOBA-Universidad de Valladolid is also acknowledged. The<br />

Mastervue Atlas Corneal Topography System used in this thesis was<br />

donated by Carl Zeiss, Spain. Cristina Cadevall (CD6-UPC)<br />

provided technical support with profilometry <strong>and</strong> customization of<br />

the Sensofar instrument. Andrés García Tante (CIDA, Madrid)<br />

manufactured or re-polished most the artificial corneas of this study.<br />

Antonio Baeza (Indra, Aranjuez, Spain) <strong>and</strong> Fern<strong>and</strong>o<br />

Sánchez (CIDA) performed contact profilometry in Chapter 3 <strong>and</strong><br />

José Sáez L<strong>and</strong>ete (Universidad Complutense de Madrid) confocal<br />

profilometry. Ablations on PMMA of Chapter 3 were performed at<br />

Centro Oftalmologico de Madrid.<br />

Rosalía Serna at Instituto de Optica (CSIC) performed<br />

ellipsometry measurements <strong>and</strong><br />

participated in useful discussions for<br />

Chapter 4, Peter Vernhout <strong>and</strong><br />

Mikhail Savvateev from Phoenix<br />

NanoTechnologies performed AFM<br />

measurements.<br />

13

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