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Scottish Universities Physics Alliance Peer-Reviewed ... - SUPA

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Logie, S<br />

Shona Logie<br />

Research Student<br />

The University of Edinburgh<br />

Zero records<br />

Long, AR<br />

Andrew Long<br />

Academic<br />

University of Glasgow<br />

1 record<br />

Gallium oxide and gadolinium gallium oxide insulators on Si delta-doped GaAs/AlGaAs<br />

heterostructures<br />

Paterson, GW; Longo, P; Wilson, JA; Craven, AJ; Long, AR; Thayne, IG; Passlack, M; Droopad, R<br />

JOURNAL OF APPLIED PHYSICS<br />

Volume: 104 Issue: 10 Article Number: 103719 (2008)<br />

Longo, P<br />

Paolo Longo<br />

Researcher<br />

University of Glasgow<br />

4 records<br />

Gallium oxide and gadolinium gallium oxide insulators on Si delta-doped GaAs/AlGaAs<br />

heterostructures<br />

Paterson, GW; Longo, P; Wilson, JA; Craven, AJ; Long, AR; Thayne, IG; Passlack, M; Droopad, R<br />

JOURNAL OF APPLIED PHYSICS<br />

Volume: 104 Issue: 10 Article Number: 103719 (2008)<br />

EFTEM and EELS SI: tools for investigating the effects of etching processes for III-V<br />

MOSFET devices - art. no. 012053<br />

Longo, P; Scott, J; Craven, AJ; Hill, RJW; Thayne, IG<br />

'Proceedings of the Electron Microscopy and Analysis Group Conference', SEP 03-07, 2007, Glasgow,<br />

SCOTLAND<br />

EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, JOURNAL<br />

OF PHYSICS CONFERENCE SERIES<br />

Volume: 126 Pages: 12053-12053 (2008)<br />

Elemental Profiling of III-V MOSFET High-k Dielectric Gate Stacks Using EELS Spectrum<br />

Imaging<br />

Longo, P; Craven, AJ; Scott, J; Holland, M; Thayne, I<br />

'Proceedings of the 15th Conference on Microscopy of Semiconducting Materials', APR 02-05, 2007,<br />

Cambridge, ENGLAND<br />

MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, SPRINGER PROCEEDINGS IN<br />

PHYSICS<br />

Volume: 120 Pages: 317-320 (2008)<br />

III-V MOSFETs for Digital Applications with Silicon Co-Integration<br />

Kalna, K; Asenov, A; Ayubi-Moak, JS; Craven, AJ; Droopad, R; Hill, R; Holland, MC; et al.<br />

'Proceedings of the 7th International Conference on Advanced Semiconductor Devices and<br />

Microsystems', OCT 12-16, 2008, Smolenice, SLOVAKIA<br />

ASDAM 2008, CONFERENCE PROCEEDINGS<br />

Pages: 39-46 (2008)<br />

240

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