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Scottish Universities Physics Alliance Peer-Reviewed ... - SUPA

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Schumacher, S<br />

Stefan Schumacher<br />

Researcher<br />

Heriot-Watt University<br />

Zero records<br />

Schwarz-Linek, J<br />

Jana Schwarz-Linek<br />

Researcher<br />

The University of Edinburgh<br />

1 record<br />

Potassium deficiency results in accumulation of ultra-high molecular weight poly-betahydroxybutyrate<br />

in a methane-utilizing mixed culture<br />

Helm, J; Wendlandt, KD; Jechorek, M; Stottmeister, U<br />

JOURNAL OF APPLIED MICROBIOLOGY<br />

Volume: 105 Issue: 4 Pages: 1054-1061 (2008)<br />

Scott, D<br />

David Scott<br />

Researcher<br />

The University of Edinburgh<br />

Zero records<br />

Scott, J<br />

Jamie Scott<br />

Researcher<br />

University of Glasgow<br />

3 records<br />

Near-simultaneous dual energy range EELS spectrum imaging<br />

Scott, J; Thomas, PJ; MacKenzie, M; McFadzean, S; Wilbrink, J; Craven, AJ; Nicholson, WAP<br />

ULTRAMICROSCOPY<br />

Volume: 108 Issue: 12 Pages: 1586-1594 (2008)<br />

EFTEM and EELS SI: tools for investigating the effects of etching processes for III-V<br />

MOSFET devices - art. no. 012053<br />

Longo, P; Scott, J; Craven, AJ; Hill, RJW; Thayne, IG<br />

'Proceedings of the Electron Microscopy and Analysis Group Conference', SEP 03-07, 2007, Glasgow,<br />

SCOTLAND<br />

EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, JOURNAL<br />

OF PHYSICS CONFERENCE SERIES, Baker, RT, Mobus, G, Brown, PD (Eds)<br />

Volume: 126 Pages: 12053-12053 (2008)<br />

Elemental Profiling of III-V MOSFET High-k Dielectric Gate Stacks Using EELS Spectrum<br />

Imaging<br />

Longo, P; Craven, AJ; Scott, J; Holland, M; Thayne, I<br />

'Proceedings of the 15th Conference on Microscopy of Semiconducting Materials', APR 02-05, 2007,<br />

Cambridge, ENGLAND<br />

MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, SPRINGER PROCEEDINGS IN<br />

PHYSICS, Cullis, AG, Midgley, PA (Eds)<br />

Volume: 120 Pages: 317-320 (2008)<br />

374

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