Influence of the natural aluminium oxide layer on ... - ALU-WEB.DE
Influence of the natural aluminium oxide layer on ... - ALU-WEB.DE
Influence of the natural aluminium oxide layer on ... - ALU-WEB.DE
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MEASURING & CONTROL<br />
Fig. 3: Sensor resp<strong>on</strong>se as a functi<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>aluminium</str<strong>on</strong>g> thickness for different phot<strong>on</strong> energies<br />
for some producers so <str<strong>on</strong>g>the</str<strong>on</strong>g>y must resort to <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
‘stop-and-measure’ technique. A single correcti<strong>on</strong><br />
factor is calculated by comparing <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
uncorrected gauge measurement to a physical<br />
c<strong>on</strong>tact measurement made while <str<strong>on</strong>g>the</str<strong>on</strong>g> strip is<br />
stopped. While simple, it limits <str<strong>on</strong>g>the</str<strong>on</strong>g> accuracy<br />
<str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> gauge to <str<strong>on</strong>g>the</str<strong>on</strong>g> accuracy <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> c<strong>on</strong>tact<br />
measurements which not <strong>on</strong>ly slow producti<strong>on</strong><br />
down, but are known to be operator dependent.<br />
The challenges <str<strong>on</strong>g>of</str<strong>on</strong>g> alloy compensati<strong>on</strong> are<br />
fur<str<strong>on</strong>g>the</str<strong>on</strong>g>r complicated when <str<strong>on</strong>g>the</str<strong>on</strong>g> <str<strong>on</strong>g>aluminium</str<strong>on</strong>g> producer<br />
rolls clad products. The alloy <str<strong>on</strong>g>layer</str<strong>on</strong>g>s have<br />
different equivalent absorpti<strong>on</strong>s which by<br />
means <str<strong>on</strong>g>of</str<strong>on</strong>g> proprietary s<str<strong>on</strong>g>of</str<strong>on</strong>g>tware can be c<strong>on</strong>verted<br />
to a single correcti<strong>on</strong> factor for that product.<br />
Without an alloy/clad compensati<strong>on</strong> algorithm,<br />
<str<strong>on</strong>g>the</str<strong>on</strong>g> compensati<strong>on</strong> approach based <strong>on</strong> sample<br />
sets for each alloy becomes a logistical headache<br />
for storage and quality assurance checks.<br />
Internati<strong>on</strong>al standards<br />
Internati<strong>on</strong>al organizati<strong>on</strong>s like <str<strong>on</strong>g>the</str<strong>on</strong>g> Aluminum<br />
Associati<strong>on</strong>, ASTM, Japanese Standards<br />
Associati<strong>on</strong> and o<str<strong>on</strong>g>the</str<strong>on</strong>g>rs provide guidance <strong>on</strong><br />
not <strong>on</strong>ly alloy chemistry tolerances, but sheet<br />
dimensi<strong>on</strong>al tolerances as well. For instrument<br />
suppliers, <str<strong>on</strong>g>the</str<strong>on</strong>g> Internati<strong>on</strong>al Electrotechnical<br />
Commissi<strong>on</strong> (IEC) has produced standards to<br />
provide guidance and definiti<strong>on</strong> for specific<br />
terms and tests used. The standards act as a<br />
c<strong>on</strong>sistent scale to compare <strong>on</strong>e instrument to<br />
ano<str<strong>on</strong>g>the</str<strong>on</strong>g>r without c<strong>on</strong>fusing nomenclature obscuring<br />
<str<strong>on</strong>g>the</str<strong>on</strong>g> true performance <str<strong>on</strong>g>of</str<strong>on</strong>g> each.<br />
The Nuclear Instrumentati<strong>on</strong> Technical<br />
Committee (IEC Technical Committee 45)<br />
produced IEC 61336 ‘Thickness measurement<br />
systems utilizing i<strong>on</strong>izing radiati<strong>on</strong> – Definiti<strong>on</strong>s<br />
and test methods’. The first committee<br />
release was in 1983, and an update was<br />
drafted in 1996. The document is available<br />
for purchase from <str<strong>on</strong>g>the</str<strong>on</strong>g> IEC at http://webstore.<br />
iec.ch/webstore/webstore.nsf/ArtNum_PK/<br />
21703?OpenDocument, as such we cannot<br />
reproduce it here. The standard first defines<br />
comm<strong>on</strong> terms in order to clarify what specific<br />
words mean. For example <str<strong>on</strong>g>the</str<strong>on</strong>g> ‘mean resp<strong>on</strong>se<br />
time’ may be called <str<strong>on</strong>g>the</str<strong>on</strong>g> ‘first time c<strong>on</strong>stant’ by<br />
some, and something else by o<str<strong>on</strong>g>the</str<strong>on</strong>g>rs. (Fig. 4)<br />
The fixed definiti<strong>on</strong>s avoid any ambiguity in<br />
interpretati<strong>on</strong>. They additi<strong>on</strong>ally provide guidance<br />
in setting up and carrying out <str<strong>on</strong>g>the</str<strong>on</strong>g> tests<br />
defined in <str<strong>on</strong>g>the</str<strong>on</strong>g> sec<strong>on</strong>d part <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> standard.<br />
The standard dedicates no less than nine<br />
terms to clarify time based parameters. Some<br />
are related to defining <str<strong>on</strong>g>the</str<strong>on</strong>g> time associated with<br />
<str<strong>on</strong>g>the</str<strong>on</strong>g> time taken to resp<strong>on</strong>d to a change, while<br />
o<str<strong>on</strong>g>the</str<strong>on</strong>g>rs are related to <str<strong>on</strong>g>the</str<strong>on</strong>g> digital processing <str<strong>on</strong>g>of</str<strong>on</strong>g><br />
signals. This is particularly critical with <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
advent <str<strong>on</strong>g>of</str<strong>on</strong>g> high speed data processors. Incoming<br />
data can be manipulated and processed by<br />
advanced filters to mask or hide true statistical<br />
variati<strong>on</strong>s. As depicted in Fig. 2 above, radiati<strong>on</strong><br />
measurements are statistical by <str<strong>on</strong>g>the</str<strong>on</strong>g>ir very<br />
nature. All noise figures should be quoted with<br />
a reference to <str<strong>on</strong>g>the</str<strong>on</strong>g> number <str<strong>on</strong>g>of</str<strong>on</strong>g> Sigmas, or c<strong>on</strong>fidence<br />
levels (CL). Most gauge manufactures<br />
present 2 sigma (95% CL) noise figures, but<br />
not all. Straightforward data processing provides<br />
for predictable results and a better representati<strong>on</strong><br />
<str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> process dynamics. If a change<br />
occurs in <str<strong>on</strong>g>the</str<strong>on</strong>g> process, advanced filtering may<br />
portray a porti<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> change, but not <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
full change. Process engineers and <str<strong>on</strong>g>the</str<strong>on</strong>g>ir AGC<br />
algorithms may over react, or under correct<br />
thanks to <str<strong>on</strong>g>the</str<strong>on</strong>g> manipulated<br />
data.<br />
In order<br />
to ethically<br />
improve <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
speed <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> sensor resp<strong>on</strong>se<br />
to change, without<br />
increasing <str<strong>on</strong>g>the</str<strong>on</strong>g> statistical<br />
noise <strong>on</strong> <str<strong>on</strong>g>the</str<strong>on</strong>g> measurement,<br />
<str<strong>on</strong>g>the</str<strong>on</strong>g> physical characteristics<br />
<str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> sensor<br />
need to be optimized for<br />
<str<strong>on</strong>g>the</str<strong>on</strong>g> applicati<strong>on</strong>. The raw<br />
signal; must be shielded to remove as much<br />
electrical noise as possible. The ideal approach<br />
for this is represented in <str<strong>on</strong>g>the</str<strong>on</strong>g> Thermo Scientific<br />
RM 210 AS X-ray thickness gauge. In this versatile<br />
instrument, <str<strong>on</strong>g>the</str<strong>on</strong>g> radiati<strong>on</strong> detector output<br />
is digitized right away. The analog detector signal<br />
is c<strong>on</strong>verted to a digital number within a<br />
few millimeters <str<strong>on</strong>g>of</str<strong>on</strong>g> its origin. This practically<br />
eliminates <str<strong>on</strong>g>the</str<strong>on</strong>g> possibility <str<strong>on</strong>g>of</str<strong>on</strong>g> electrical noise<br />
impinging <strong>on</strong> <str<strong>on</strong>g>the</str<strong>on</strong>g> signal. In comparis<strong>on</strong> tests,<br />
following <str<strong>on</strong>g>the</str<strong>on</strong>g> IEC 61336 guide, <str<strong>on</strong>g>the</str<strong>on</strong>g> noise <strong>on</strong><br />
<str<strong>on</strong>g>the</str<strong>on</strong>g> new designed detector improved by a factor<br />
<str<strong>on</strong>g>of</str<strong>on</strong>g> 30%. Additi<strong>on</strong>ally, users <str<strong>on</strong>g>of</str<strong>on</strong>g> this system<br />
can benefit fur<str<strong>on</strong>g>the</str<strong>on</strong>g>r by taking advantage <str<strong>on</strong>g>of</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
detector’s ability to operate at a 1 ms mean<br />
resp<strong>on</strong>se time. At this speed, and with <str<strong>on</strong>g>the</str<strong>on</strong>g> reduced<br />
noise, process engineers have <str<strong>on</strong>g>the</str<strong>on</strong>g> tools<br />
to analyze data at high speeds, revealing mill<br />
chatter and o<str<strong>on</strong>g>the</str<strong>on</strong>g>r higher frequency anomalies.<br />
In a typical rolling mill that produces can<br />
stock <str<strong>on</strong>g>aluminium</str<strong>on</strong>g> at 250 um, <str<strong>on</strong>g>the</str<strong>on</strong>g> noise at a 10<br />
ms mean resp<strong>on</strong>se time might be <strong>on</strong> <str<strong>on</strong>g>the</str<strong>on</strong>g> order<br />
<str<strong>on</strong>g>of</str<strong>on</strong>g> ±0.20% (2 sigma). With <str<strong>on</strong>g>the</str<strong>on</strong>g> improved<br />
signal processing <str<strong>on</strong>g>of</str<strong>on</strong>g> this system <str<strong>on</strong>g>the</str<strong>on</strong>g> noise will<br />
drop to ±0.15% (2-sigma). For a mill that produces<br />
200,000 t<strong>on</strong>nes a year, that translates<br />
to a savings <str<strong>on</strong>g>of</str<strong>on</strong>g> almost $200,000 in <str<strong>on</strong>g>aluminium</str<strong>on</strong>g><br />
material al<strong>on</strong>e (using <str<strong>on</strong>g>aluminium</str<strong>on</strong>g> price at $1<br />
per pound).<br />
An additi<strong>on</strong>al benefit to digitizing <str<strong>on</strong>g>the</str<strong>on</strong>g> signal<br />
so early in its journey to <str<strong>on</strong>g>the</str<strong>on</strong>g> AGC system,<br />
is speed. Once digitized, <str<strong>on</strong>g>the</str<strong>on</strong>g> data can be processed<br />
with out <str<strong>on</strong>g>the</str<strong>on</strong>g> time c<strong>on</strong>suming ADC/DAC<br />
c<strong>on</strong>versi<strong>on</strong>s. The reducti<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> a few millisec<strong>on</strong>ds<br />
<str<strong>on</strong>g>of</str<strong>on</strong>g> process delay time can assure <str<strong>on</strong>g>the</str<strong>on</strong>g> AGC<br />
has time to fully correct any strip thickness<br />
deviati<strong>on</strong>s. This can result in higher quality<br />
product.<br />
Data archiving<br />
A final benefit is realized in <str<strong>on</strong>g>the</str<strong>on</strong>g> powerful tool<br />
<str<strong>on</strong>g>of</str<strong>on</strong>g> data archiving. This ideal system is available<br />
with a s<str<strong>on</strong>g>of</str<strong>on</strong>g>tware feature that stores any<br />
gauge data stream in <str<strong>on</strong>g>the</str<strong>on</strong>g> iba ‘.dat’ format. This<br />
format is gaining popularity as <str<strong>on</strong>g>the</str<strong>on</strong>g> iba PDA<br />
data analysis tool also grows in popularity.<br />
Fig. 4: Graphical representati<strong>on</strong> <str<strong>on</strong>g>of</str<strong>on</strong>g> gauge resp<strong>on</strong>se<br />
to an instantaneous thickness change<br />
24 <strong>ALU</strong>MINIUM · EAC CONGRESS 2011