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Qualification of the Assembly Process of Flip-Chip BGA Packages ...

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Cleaning<br />

Texas Tech University, Nivetha Shivan, May 2012<br />

De-ionized water ultrasonic cleaner is used for ultrasonic (38 kHz) cleaning for minimum<br />

15 minutes. This ensures devices are cleaned and are free <strong>of</strong> flux residues.<br />

Drying<br />

The units are subjected to drying for 5 minutes at 125 deg C or at room temperature until<br />

dry. This ensures devices are dry prior to electrical tests.<br />

Visual inspection: The units are visually inspected which helps check for damage during<br />

reflow process.<br />

5.1.1.3 CSAM after MSL pre-conditioning<br />

CSAM analysis is performed on <strong>the</strong> devices to check for any delaminations/voids in <strong>the</strong><br />

package.<br />

5.1.1.4 Temperature Cycling and Pressure Cooker Test<br />

Following MSL, <strong>the</strong> units are subjected to stress tests like temperature cycling and<br />

pressure cooker test. The read points for temperature cycling were after 500 cycles and<br />

1000 cycles. Similarly, <strong>the</strong> read points for pressure cooker tests were after 168 hours and<br />

288 hours.<br />

5.1.1.5 Final Measurements<br />

Visual examination and CSAM analysis are performed on <strong>the</strong> devices.<br />

5.1.1.6 Shadow Moiré Test<br />

The warpage <strong>of</strong> <strong>the</strong> package was measured on <strong>the</strong> substrate surface. These measurements<br />

are conducted at following temperatures: 25°C, 100°C, 150°C, 183°C, 200°C, 220°C,<br />

240°C, 260°C, 240°C, 220°C, 200°C, 183°C, 150°C, 100°C, and 25°C.<br />

50

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