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Name (Title):<br />
Ayako Hashimoto (NIMS Postdoctor Researcher)<br />
Affiliation:<br />
International Center for Young Scientists – Sengen, NIMS<br />
Address:<br />
1-2-1 sengen, Tsukuba, Ibaraki 305-0047, Japan<br />
Email: HASHIMOTO.Ayako@nims.go.jp<br />
Home Page:<br />
Presentation Title:<br />
Three-dimensional Imaging with Confocal Scanning Transmission Electron Microscopy<br />
<strong>Abstract</strong>:<br />
Three-dimensional (3D) imaging has been an indispensable technique in various industrial and<br />
scientific fields. Recently, confocal scanning transmission electron microscopy (STEM), which is<br />
based on applying the principles of confocal imaging to transmission electron microscopy, has<br />
attracted considerable interest as a promising depth-sectioning and 3D imaging technique [1,2].<br />
Figure 1 shows a schematic drawing of the confocal STEM configuration. Depth sectioning can<br />
be performed by rejecting electrons from an out-of-focal plane in a specimen (broken lines).<br />
However, 3D imaging with confocal STEM has not yet been established because of practical<br />
difficulties. In this work, we developed a stage-scanning system for STEM in order to overcome<br />
the difficulties and applied to confocal<br />
imaging. By using the system, only the<br />
specimen is moved three-dimensionally<br />
under the fixed lens configuration. A<br />
specimen holder with a piezo-driven stage<br />
was modified and controlled by computer<br />
programming for stage scanning. Detected<br />
signals are synchronized with the specimen<br />
displacement and are displayed on a<br />
computer screen as a stage-scanning STEM<br />
image, as shown in Fig.1. Observation of<br />
gold particles demonstrated that the<br />
developed system is capable of atomicresolution<br />
STEM imaging at desired Z<br />
positions. Further, confocal STEM images<br />
could be obtained under the confocal lens<br />
configuration. Details of the stage-scanning<br />
system and obtained results will be<br />
discussed.<br />
References :<br />
[1] N. J. Zaluzec, Microsc. Today Vol. 6 (2003) 8-12.<br />
[2] P. D. Nellist, G. Behan, A. I. Kirkland, and C. J. D. Hetherington, Appl. Phys. Lett. Vol. 89<br />
(2006) 124105.<br />
32<br />
Oral Presentation 32<br />
Fig.1 Illustration of the confocal STEM configuration and<br />
stage-scanning system.