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Name (Title):<br />

Ayako Hashimoto (NIMS Postdoctor Researcher)<br />

Affiliation:<br />

International Center for Young Scientists – Sengen, NIMS<br />

Address:<br />

1-2-1 sengen, Tsukuba, Ibaraki 305-0047, Japan<br />

Email: HASHIMOTO.Ayako@nims.go.jp<br />

Home Page:<br />

Presentation Title:<br />

Three-dimensional Imaging with Confocal Scanning Transmission Electron Microscopy<br />

<strong>Abstract</strong>:<br />

Three-dimensional (3D) imaging has been an indispensable technique in various industrial and<br />

scientific fields. Recently, confocal scanning transmission electron microscopy (STEM), which is<br />

based on applying the principles of confocal imaging to transmission electron microscopy, has<br />

attracted considerable interest as a promising depth-sectioning and 3D imaging technique [1,2].<br />

Figure 1 shows a schematic drawing of the confocal STEM configuration. Depth sectioning can<br />

be performed by rejecting electrons from an out-of-focal plane in a specimen (broken lines).<br />

However, 3D imaging with confocal STEM has not yet been established because of practical<br />

difficulties. In this work, we developed a stage-scanning system for STEM in order to overcome<br />

the difficulties and applied to confocal<br />

imaging. By using the system, only the<br />

specimen is moved three-dimensionally<br />

under the fixed lens configuration. A<br />

specimen holder with a piezo-driven stage<br />

was modified and controlled by computer<br />

programming for stage scanning. Detected<br />

signals are synchronized with the specimen<br />

displacement and are displayed on a<br />

computer screen as a stage-scanning STEM<br />

image, as shown in Fig.1. Observation of<br />

gold particles demonstrated that the<br />

developed system is capable of atomicresolution<br />

STEM imaging at desired Z<br />

positions. Further, confocal STEM images<br />

could be obtained under the confocal lens<br />

configuration. Details of the stage-scanning<br />

system and obtained results will be<br />

discussed.<br />

References :<br />

[1] N. J. Zaluzec, Microsc. Today Vol. 6 (2003) 8-12.<br />

[2] P. D. Nellist, G. Behan, A. I. Kirkland, and C. J. D. Hetherington, Appl. Phys. Lett. Vol. 89<br />

(2006) 124105.<br />

32<br />

Oral Presentation 32<br />

Fig.1 Illustration of the confocal STEM configuration and<br />

stage-scanning system.

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