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Name (Title):<br />

Jian-Yong LI (MANA Research Associate)<br />

Affiliation:<br />

International Center for Materials Nanoarchitectonics.<br />

National Institute for Materials Science<br />

Address:<br />

1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan<br />

Email: LI.Jianyong@nims.go.jp<br />

Home Page: http://www.nims.go.jp/mana/<br />

Presentation Title:<br />

Electric Properties of Nano-structured Metal Oxides II<br />

<strong>Abstract</strong>:<br />

Perovskite-type oxides possess useful functions such as ferroelectricity. Thus, many<br />

investigations on nano-sized perovskite-type metal oxide is currently extensively studied. For<br />

developments of nano-sized ferroelectric materials, so-called size-effects, that is suppression of<br />

ferroelectricity by reduction of grain size,. is one of the crucial issues. Although the size effect<br />

has to be considered for developments of micro-devices using ferroelectric metal oxides, there<br />

are many difficulties on evaluation of size effects in those materials. Electric field induced<br />

property changes in nano-sized metal oxides are also very important issue. If we apply constant<br />

bias to a certain material having different size, the filed strength increases proportionally to the<br />

inverse material size. In fact, it has been indicated that paraelectric phases transforms to<br />

ferroelectric phase by applying very high electric field, and, recently, electric field induced<br />

resistance switching is a fascinating topic in terms of non-volatile memory applications. Thus, we<br />

have to consider materials size-effect and field strength when we deal with the electric response<br />

from nano-sized mater.<br />

In this study, Pt/n-SrTiO3 interfaces have been<br />

investigated to elucidate properties of nano-sized<br />

SrTiO3 under very high field strength. Since the<br />

depletion layer width is in nanometric scale in these<br />

junctions, the filed strength in for this depletion layer<br />

was more than 10MV/m. As seen in the figure, we<br />

observed obvious resistance switching behavior at<br />

Pt/n-SrTiO3 junction. From these results, we discuss<br />

size effect and field induced property change within<br />

the depletion layer having nanometric scale thickness.<br />

In fact, we could see huge deviation of electric<br />

properties from ordinary Schottky junction model.<br />

Detailed results will be presented in the<br />

conference.<br />

Poster Session PM-25<br />

Typical resistance switching behavior observed<br />

at Pt/n-SrTiO3 interface. Here, n-SrTiO3 was<br />

obtained by substituting niobium for titanium.<br />

67

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