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Name (Title):<br />
Jian-Yong LI (MANA Research Associate)<br />
Affiliation:<br />
International Center for Materials Nanoarchitectonics.<br />
National Institute for Materials Science<br />
Address:<br />
1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan<br />
Email: LI.Jianyong@nims.go.jp<br />
Home Page: http://www.nims.go.jp/mana/<br />
Presentation Title:<br />
Electric Properties of Nano-structured Metal Oxides II<br />
<strong>Abstract</strong>:<br />
Perovskite-type oxides possess useful functions such as ferroelectricity. Thus, many<br />
investigations on nano-sized perovskite-type metal oxide is currently extensively studied. For<br />
developments of nano-sized ferroelectric materials, so-called size-effects, that is suppression of<br />
ferroelectricity by reduction of grain size,. is one of the crucial issues. Although the size effect<br />
has to be considered for developments of micro-devices using ferroelectric metal oxides, there<br />
are many difficulties on evaluation of size effects in those materials. Electric field induced<br />
property changes in nano-sized metal oxides are also very important issue. If we apply constant<br />
bias to a certain material having different size, the filed strength increases proportionally to the<br />
inverse material size. In fact, it has been indicated that paraelectric phases transforms to<br />
ferroelectric phase by applying very high electric field, and, recently, electric field induced<br />
resistance switching is a fascinating topic in terms of non-volatile memory applications. Thus, we<br />
have to consider materials size-effect and field strength when we deal with the electric response<br />
from nano-sized mater.<br />
In this study, Pt/n-SrTiO3 interfaces have been<br />
investigated to elucidate properties of nano-sized<br />
SrTiO3 under very high field strength. Since the<br />
depletion layer width is in nanometric scale in these<br />
junctions, the filed strength in for this depletion layer<br />
was more than 10MV/m. As seen in the figure, we<br />
observed obvious resistance switching behavior at<br />
Pt/n-SrTiO3 junction. From these results, we discuss<br />
size effect and field induced property change within<br />
the depletion layer having nanometric scale thickness.<br />
In fact, we could see huge deviation of electric<br />
properties from ordinary Schottky junction model.<br />
Detailed results will be presented in the<br />
conference.<br />
Poster Session PM-25<br />
Typical resistance switching behavior observed<br />
at Pt/n-SrTiO3 interface. Here, n-SrTiO3 was<br />
obtained by substituting niobium for titanium.<br />
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