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Characterization and control of the fiber-matrix interface in ceramic ...

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APPENDIX A. AUGER ELECTRON SPECTROSCOPY<br />

The Auger electron spectroscopy techniques for chemical analysis <strong>of</strong><br />

surfaces is based on <strong>the</strong> Auger radiationless process. A core-level<br />

electron is ionized by an imp<strong>in</strong>g<strong>in</strong>g electron, <strong>and</strong> <strong>the</strong> atom can decay to a<br />

lower-energy state through electronic rearrangement. The ejected<br />

electron, or Auger electron, will possess a k<strong>in</strong>etic energy that is<br />

proportional to <strong>the</strong> difference <strong>in</strong> energy states, <strong>and</strong> this energy is<br />

characteristic <strong>of</strong> <strong>the</strong> parent atom. The Auger electrons can <strong>the</strong>n be<br />

captured <strong>and</strong> analyzed to determ<strong>in</strong>e surface compositions by analysis <strong>of</strong><br />

<strong>the</strong> peaks <strong>in</strong> <strong>the</strong> Auger spectrum. Table A-1 lists <strong>the</strong> spectral peaks for<br />

elements pert<strong>in</strong>ent to <strong>the</strong> exam<strong>in</strong>ed composites as listed <strong>in</strong> "H<strong>and</strong>book <strong>of</strong><br />

Auger Electron Spectroscopy," L. E. Davis et al., Physical Electronics<br />

Division, Perk<strong>in</strong>-Elmer Corporation, Eden Prairie, M<strong>in</strong>nesota.<br />

19 5

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