William Angerer - Department of Physics and Astronomy - University ...

81
Ai ).~
t
1 1.023798 0.00377588 J-Lm 2
2 1.058264 0.01222544 J-Lm 2
3 5.280792 321.3616 J-Lm 2
Table 4.1: Constants for sapphire Sell meier equation
4.1.2 Theory and Analysis
vVe developed a simple theory to analyze the reflected light from a thin dielectric film
on a semi-infinite slab. We used the standard Sellmeier equation for the ordinary
index of refraction for sapphire [561
(4.3)
The parameters for the Sell meier equation are displayed in Table 4.1. The extraordinary
index of refraction, tabulated in [57], is "'-'.01 less than the ordinary index of
refraction. Since the sapphire index of refraction only affects Fresnel coefficients and
not phases, our assumption of an isotropic index of refraction is valid. vVe initially
assumed the value for the index of refraction of CaN found in the literature [581 in
order to determine a first guess about the film thickness. The film thickness and
index of refraction for CaN were then determined iteratively.
Fig. 4.3 displays reflected and transmitted fields in the CaN thin film. The re-
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