23.05.2014 Views

William Angerer - Department of Physics and Astronomy - University ...

William Angerer - Department of Physics and Astronomy - University ...

William Angerer - Department of Physics and Astronomy - University ...

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

73<br />

ing identical optical components in the sample <strong>and</strong> reference arms. The potentially<br />

greatest cause <strong>of</strong> discrepancy is the beam splitter. Our beam splitter was optically<br />

engineered to reflect 10% <strong>of</strong> a p-polarized incident beam at an angle <strong>of</strong> incidence<br />

<strong>of</strong> 45°. I tested the relative spectral responses <strong>of</strong> the two arms by measuring the<br />

SHG signal with y-cut quartz in both the sample <strong>and</strong> reference arm. For both the<br />

p-polarized <strong>and</strong> s-polarized input Ti:AI 2 0 3 pulses, the relative response <strong>of</strong> the sample<br />

arm to the reference arm varied repeatedly <strong>and</strong> predictably by less than 15%.<br />

In order to fully eliminate both effects <strong>of</strong> the Ti:Ah03 pulse's characteristics<br />

<strong>and</strong> the inherent spectral response <strong>of</strong> the detection system, nonlinear signals <strong>of</strong><br />

GaN / Ah03 are reported as<br />

[ reported ( - 2 )­<br />

GaN W - Wo -<br />

SAN<br />

[ s&mple( -'l )<br />

w-~o<br />

[r"'rence(w=2w )<br />

quartz 0<br />

[ s&mple ( -2w ) •<br />

quartz w- 0<br />

/reference(w=2w )<br />

quartz 0<br />

(3.2)<br />

\"ote that I!:;:"/!le(w = 2wo) refers to the measured second-harmonic intensity <strong>of</strong> Ga.\"<br />

in the sample arm. The first measurement in equation (3.2).<br />

(3.3)<br />

measures a relative value <strong>of</strong> the signal from GaN that is free <strong>of</strong> the spectral characteristics<br />

<strong>of</strong> the laser source <strong>and</strong> fluctuations in the laser power. The second measurement.<br />

I<br />

sample( 2)<br />

quartz W = Wo<br />

[reference (W - 2w )'<br />

quartz - 0<br />

(3..!)<br />

is also free <strong>of</strong> the spectral characteristics <strong>of</strong> the laser <strong>and</strong> fluctuations in laser power. In<br />

addition, this measurement determines the response <strong>of</strong> the detection system. There-<br />

Reproduced with permission <strong>of</strong> the copyright owner. Further reproduction prohibited without permission.

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!