William Angerer - Department of Physics and Astronomy - University ...

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complex index of refraction, is presented is Appendi.x D. For a real index of refraction,
the expression for the real part of BC· is
Real(BC") = '12.
( 4.37)
Thus, combining equations (4.36) and (4.37) determines T as
T = TJ2 tt*
TJo
( ·1.38)
where
2TJo
t = ----'-­
TJoB + C
( 4.39)
For an l layer stack, the equations (4.26) and (4.38) are modified as
(4.40)
and
T = TJI+l tt*,
TJo
(4.41)
where Ali is defined as equation (4.25) with its characteristic thickness, d i , and angle
of incidence of the fields, ()i. Note, the layers are labeled from 1, which is the layer
adjacent to the incident medium, to l, which is the layer adjacent to the substrate
material.
In contrast to the HeNe and Ar ion lasers used in the thin film thickness measurements,
the Xe lamp has a non-negligible bandwidth that must be accounted for in
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