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William Angerer - Department of Physics and Astronomy - University ...

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135<br />

A<br />

degrease<br />

substrate<br />

et ch s u tGt rate<br />

in H 3P04H2S04<br />

cleaning<br />

procedures<br />

B<br />

heat sample<br />

introduce gas<br />

pre cuss as<br />

to reaction chambers<br />

grow AIN buffer layer<br />

using triethylalumimum (TEA)<br />

<strong>and</strong> ammonia<br />

pre cuss as diffuse to<br />

sam pie <strong>and</strong> nucleate crt<br />

sample surface<br />

grow GaN layer<br />

using triethylgallium (TEG)<br />

<strong>and</strong> ammonia<br />

850°C<br />

vent unreacted gases <strong>and</strong><br />

byproducts through exhaust<br />

system<br />

Figure 5.8: Flow diagram for LPMOCVD growth <strong>of</strong> GaN on Ah03' Diagram A<br />

represents the general procedures for growth. Diagram B represents specific procedures<br />

involved in the growth <strong>of</strong> the AIN <strong>and</strong> GaN films. The box with the thick lines<br />

represents the steps in the nucleation <strong>of</strong> the film<br />

Reproduced with permission <strong>of</strong> the copyright owner. Further reproduction prohibited without permission.

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