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William Angerer - Department of Physics and Astronomy - University ...

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97<br />

Sellmeier constant<br />

value<br />

Al 4.081<br />

Al 0.16980<br />

A2 0.1361<br />

A2 .3453<br />

Table 4.2: Empirical constant for GaN Sell meier equation. The Ai parameters are<br />

expressed in J.tm.<br />

by a normalized Gaussian frequency distribution, i.e. equation (4.-12). \Ve performed<br />

a least squares fit to the data with the index <strong>of</strong> refraction as the only free parameter.<br />

Appendix F discusses our optimization methods. This method is used for all data<br />

fitting in this thesis.<br />

Fig. 4.7 displays transmission data <strong>and</strong> calculations for a 1.020 J.tm Ga);' film on<br />

A1 2 0 3 . This measurement was repeated in ",0.1 eV increments from A = 370-900 nm.<br />

vVe fitted the observed dispersion in the GaN index <strong>of</strong> refraction with a two term<br />

Sellmeier equation<br />

n{A) = (4.43)<br />

The empirically determined constants for the Sell meier equation are displayed in<br />

Table 4,2. This dispersion relationship holds for all <strong>of</strong> our GaN samples.<br />

GaN, like sapphire, is a birefringent material. However, all calculations <strong>of</strong> the<br />

Reproduced with permission <strong>of</strong> the copyright owner. Further reproduction prohibited without permission.

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