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William Angerer - Department of Physics and Astronomy - University ...

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84<br />

4.2 Measurement <strong>of</strong> Indices <strong>of</strong> Refraction <strong>and</strong> Absorption Coefficient<br />

We measured the index <strong>of</strong> refraction <strong>and</strong> absorption coefficient for GaN over an energy<br />

range from the VV to the IR. These measurements are essential for an accurate<br />

determination <strong>of</strong> X~Jk(w = 2wo).<br />

4.2.1 Experimental Techniques<br />

We measured the real <strong>and</strong> imaginary parts <strong>of</strong> the dielectric function with the apparatus<br />

shown in Fig. 4.5. The light source was an Oriel 450 W Xe lamp with an f/1.0 CV<br />

enhanced lens. The spectral range <strong>of</strong> this lamp is 200-2500 nm. The wavelength was<br />

selected by a Jarrel Ash Monospec 25 monochrometer with a 1200 grooves/mm grating.<br />

The wavelength <strong>of</strong> the monochrometer was selected by a computer controlled<br />

stepper motor. The light from the monochrometer was p-polarized <strong>and</strong> a fraction<br />

was used to remove temporal fluctuations as in section 4.1.1. The sample was rotated<br />

by a stepper motor to change the angle <strong>of</strong> incidence. By measuring transmitted<br />

light intensity as a function <strong>of</strong> the angle <strong>of</strong> incidence, the dielectric constant can be<br />

accurately determined.<br />

4.2.2 Calculations <strong>of</strong> Dielectric Constants<br />

'vVe formulate a description <strong>of</strong> the transmission <strong>of</strong> light through a multilayer film by<br />

matrix methods [56, 59]. The technique relates the tangential electric <strong>and</strong> magnetic<br />

Reproduced with permission <strong>of</strong> the copyright owner. Further reproduction prohibited without permission.

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