William Angerer - Department of Physics and Astronomy - University ...

182
~ 20 _____
~ ____
J -----f- ----t -----f- ----1
I
1
-1 I
>-CIl
C
CD
-C
c.::>
I
(/)
....
10 -1
~
sr
t
I
01 l
0 50 100 150
¢
J
I
j
I
l
I
--j
I
-J
~
I
-i
Figure 7...1: SHG rotational symmetry of Si (100) and Si(l11) measured by the nonlinear
optical microscope. 0 is the experimental data from Si (100) and the solid
line is an isotropic fit to the data. 0 is the experimental data from Si (111) and the
dashed line is an isotropic fit to the data.
from Si (111) and Si (100) (see Fig. 7.4). We used silicon as a reference material
to test the alignment of the nonlinear optical microscope. Sipe and coworkers [108]
have calculated the second-harmonic response for the (100), (111), and (110) faces
of Si. They determined that second-harmonic generation from both the surface and
the bulk is forbidden from Si (100) excited by a plane wave fundamental beam at
normal incidence. Although a nonlinear polarization is generated in Si (100) excited
Reproduced with permission of the copyright owner. Further reproduction prohibited without permission.