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William Angerer - Department of Physics and Astronomy - University ...

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121<br />

ref. sample defect energy method<br />

[88] undoped VCa vb + 1.0 eV photocapacitance <strong>and</strong> optical<br />

current deep level transient<br />

spectroscopy<br />

[80] p-type I(Ga) or I(N) vb +1.8 eV deep level transient spectroscopy<br />

?<br />

vb + .45 eV spectroscopy <strong>and</strong> photoemission<br />

?<br />

vb + .30 eV capacitance spectroscopy<br />

?<br />

vb + .21 eV<br />

[53] n-type ~:v cb + .8 eV very high pressure optical<br />

absorption. transmission,<br />

luminescence <strong>and</strong> Raman<br />

scattering<br />

[89J undoped ?<br />

vb + .72 eV photothermal deflection<br />

?<br />

vb + .22 eV spectroscopy <strong>and</strong> constant<br />

photothermal current method<br />

[90] undoped<br />

?<br />

cb-.042 eV photoluminescence <strong>and</strong><br />

<strong>and</strong> doped<br />

?<br />

cb - 1.0 eV optically detected<br />

?<br />

vb + .19 eV magnetic resonance<br />

p-doped ?<br />

vb + .5 eV<br />

Table 5.3: Defects in GaN<br />

Reproduced with permission <strong>of</strong> the copyright owner. Further reproduction prohibited without permission.

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