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William Angerer - Department of Physics and Astronomy - University ...

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2.5 ~ovel Technique <strong>and</strong> Apparatus to Measure Ultrafast Pulses<br />

2.6 Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . .<br />

-t4<br />

·jO<br />

3 Experimental Ultrafast Nonlinear Optical Spectroscopy<br />

51<br />

3.1<br />

3.2<br />

Optical Setup . .<br />

Data Acquisition<br />

51<br />

55<br />

3.3 Ti:Ah03 Laser ....... . . .<br />

56<br />

3.3.1 Techniques for Optimizing the Performance <strong>of</strong> the Ti:AI 2 0 3 Laser 64<br />

3.4<br />

3.5<br />

Autocorrelation<br />

~ ormalization .<br />

67<br />

71<br />

4 Linear Optical Measurements<br />

75<br />

-l.1<br />

Linear Measurement <strong>of</strong> Film Thicknesses<br />

-l.1.1 Experimental Techniques .<br />

-l.1.2 Theory <strong>and</strong> Analysis ...<br />

76<br />

76<br />

81<br />

-l.2 ~leasurement <strong>of</strong> Indices <strong>of</strong> Refraction <strong>and</strong> Absorption Coefficient. 8-l<br />

-l.2.1<br />

4.2.2<br />

Experimental Techniques . . . . . . .<br />

Calculations <strong>of</strong> Dielectric Constants .<br />

8-l<br />

8-l<br />

4.3<br />

Photoluminescence <strong>of</strong> CaN . . . . . . . . . .<br />

102<br />

5 Properties <strong>of</strong> GaN<br />

5.1 Crystal Structure<br />

110<br />

112<br />

Reproduced with permission <strong>of</strong> the copyright owner. Further reproduction prohibited without permission.

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