12.07.2015 Views

Ultralow power ARM-based 32-bit MCU with 384 Kbytes Flash ... - Keil

Ultralow power ARM-based 32-bit MCU with 384 Kbytes Flash ... - Keil

Ultralow power ARM-based 32-bit MCU with 384 Kbytes Flash ... - Keil

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STM<strong>32</strong>L162VD, STM<strong>32</strong>L162ZD, STM<strong>32</strong>L162QD, STM<strong>32</strong>L162RDElectrical characteristicsTable 60. ADC accuracy (1)(2)Symbol Parameter Test conditions Min (3) Typ Max (3) UnitETEOEGEDTotal unadjusted errorOffset errorGain errorDifferential linearity error2.4 V ≤ V DDA ≤ 3.6 V2.4 V ≤ V REF+ ≤ 3.6 Vf ADC = 8 MHz, R AIN = 50 ΩT A = -40 to 105 ° C----211.51423.52EL Integral linearity error - 1.7 3ENOBSINADEffective number of <strong>bit</strong>sSignal-to-noise anddistorsion ratio2.4 V ≤ V DDA ≤ 3.6 VV DDA = V REF+f ADC = 16 MHz, R AIN = 50 ΩT A = -40 to 105 ° C1 kHz ≤ F input ≤ 100 kHzLSB9.2 10 - <strong>bit</strong>s57.5 62 -SNR Signal-to-noise ratio 57.5 62 -THD Total harmonic distorsion -74 -75 -ETTotal unadjusted error- 4 6.5EO Offset error 2.4 V ≤ V DDA ≤ 3.6 V- 2 4EG Gain error1.8 V ≤ V REF+ ≤ 2.4 Vf ADC = 4 MHz, R AIN = 50 Ω- 4 6ED Differential linearity error T A = -40 to 105 ° C- 1 2EL Integral linearity error - 1.5 3ET Total unadjusted error2 3EOEGEDOffset errorGain errorDifferential linearity error1.8 V ≤ V DDA ≤ 2.4 V1.8 V ≤ V REF+ ≤ 2.4 Vf ADC = 4 MHz, R AIN = 50 ΩT A = -40 to 105 ° C11.511.522EL Integral linearity error 1 1.51. ADC DC accuracy values are measured after internal calibration.2. ADC accuracy vs. negative injection current: injecting negative current on any of the standard (non-robust) analog inputpins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analoginput. It is recommended to add a Schottky diode (pin to ground) to standard analog pins which may potentially injectnegative current.Any positive injection current <strong>with</strong>in the limits specified for I INJ(PIN) and ΣI INJ(PIN) in Section 6.3.12 does not affect the ADCaccuracy.3. Based on characterization, not tested in production.dBLSBLSBDoc ID 022268 Rev 2 103/124

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