12.07.2015 Views

Ultralow power ARM-based 32-bit MCU with 384 Kbytes Flash ... - Keil

Ultralow power ARM-based 32-bit MCU with 384 Kbytes Flash ... - Keil

Ultralow power ARM-based 32-bit MCU with 384 Kbytes Flash ... - Keil

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Electrical characteristicsSTM<strong>32</strong>L162VD, STM<strong>32</strong>L162ZD, STM<strong>32</strong>L162QD, STM<strong>32</strong>L162RD6.3.13 I/O port characteristicsTable 47.General input/output characteristicsUnless otherwise specified, the parameters given in Table 47 are derived from testsperformed under the conditions summarized in Table 10. All I/Os are CMOS and TTLcompliant.I/O static characteristicsSymbol Parameter Conditions Min Typ Max UnitV ILV IHV ILV IHV hysInput low level voltageV SS - 0.3 0.8TTL portsStandard I/O input high level voltage2.7 V ≤V DD ≤3.6 V 2 (1) V DD +0.3FT (2) I/O input high level voltage 5.5VInput low level voltageStandard I/O Input high level voltageFT (5) I/O input high level voltageCMOS ports1.65 V ≤V DD ≤ 3.6 VCMOS ports1.65 V ≤V DD ≤ 3.6 VCMOS ports1.65 V ≤V DD ≤ 2.0 VCMOS ports2.0 V≤V DD ≤ 3.6 V–0.3 0.3V DD(3)0.7 V DD(3)(4)Standard I/O Schmitt trigger voltagehysteresis (6) 10% V DD(7)V DD +0.35.255.5VI lkg Input leakage current (8)(3) V SS ≤V IN ≤V DDI/Os <strong>with</strong> LCDV SS ≤V IN ≤V DDI/Os <strong>with</strong> analogswitchesV SS ≤V IN ≤V DDI/Os <strong>with</strong> analogswitches and LCDV SS ≤V IN ≤V DDI/Os <strong>with</strong> USBV SS ≤V IN ≤V DDStandard I/Os±50±50±50TBD±50nAR PU Weak pull-up equivalent resistor (9)(3) V IN = V SS 30 45 60 kΩR PD Weak pull-down equivalent resistor (9)(3) V IN = V DD 30 45 60 kΩC IO I/O pin capacitance 5 pF1. Guaranteed by design.2. FT = 5V tolerant. To sustain a voltage higher than VDD +0.5 the internal pull-up/pull-down resistors must be disabled.3. Tested in production4. 0.7V DD for 5V-tolerant receiver5. FT = Five-volt tolerant.6. Hysteresis voltage between Schmitt trigger switching levels. Based on characterization, not tested in production.7. With a minimum of 200 mV. Based on characterization, not tested in production.90/124 Doc ID 022268 Rev 2

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