Ultralow power ARM-based 32-bit MCU with 384 Kbytes Flash ... - Keil

STM32L162VD, STM32L162ZD, STM32L162QD, STM32L162RDElectrical characteristicsStatic latch-upTwo complementary static tests are required on six parts to assess the latch-upperformance:● A supply overvoltage is applied to each power supply pin● A current injection is applied to each input, output and configurable I/O pinThese tests are compliant with EIA/JESD 78A IC latch-up standard.Table 45.Electrical sensitivitiesSymbol Parameter Conditions ClassLU Static latch-up class T A = +105 °C conforming to JESD78A II level A6.3.12 I/O current injection characteristicsAs a general rule, current injection to the I/O pins, due to external voltage below V SS orabove V DD (for standard pins) should be avoided during normal product operation. However,in order to give an indication of the robustness of the microcontroller in cases whenabnormal injection accidentally happens, susceptibility tests are performed on a samplebasis during device characterization.Functional susceptibility to I/O current injectionWhile a simple application is executed on the device, the device is stressed by injectingcurrent into the I/O pins programmed in floating input mode. While current is injected into theI/O pin, one at a time, the device is checked for functional failures.The failure is indicated by an out of range parameter: ADC error, out of spec currentinjection on adjacent pins or other functional failure (for example reset, oscillator frequencydeviation, LCD levels, etc.).The test results are given in the following table.Table 46.I/O current injection susceptibilityFunctional susceptibilitySymbolDescriptionNegativeinjectionPositiveinjectionUnitI INJ Injected current on all 5 V tolerant (FT) pins -5 +0Injected current on true open-drain pins -5 +0mAInjected current on any other pin -5 +5Doc ID 022268 Rev 2 89/124