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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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166 Chapter 6<br />

<strong>to</strong> balance the units in our equation, there must be an additional fac<strong>to</strong>r whose<br />

dimensions are m 2 . This fac<strong>to</strong>r is the ionization cross section �A for creating<br />

a vacancy in an inner shell <strong>of</strong> element A. Such a cross section can be<br />

interpreted as a target area for inelastic scattering <strong>of</strong> an incident electron by<br />

the a<strong>to</strong>m, as discussed Section 4.3. The value <strong>of</strong> �A depends on the type <strong>of</strong><br />

inner shell (K, L, etc.) as well as on the a<strong>to</strong>mic number <strong>of</strong> the element.<br />

Still missing from our equation is a fac<strong>to</strong>r known as the fluorescence<br />

yield that allows for the fact that not every inner-shell vacancy gives rise <strong>to</strong><br />

the emission <strong>of</strong> an x-ray pho<strong>to</strong>n during the de-excitation <strong>of</strong> the a<strong>to</strong>m. <strong>An</strong><br />

alternative process allows the excited a<strong>to</strong>m <strong>to</strong> return <strong>to</strong> its ground state by<br />

donating energy <strong>to</strong> another electron within the a<strong>to</strong>m, which is ejected as an<br />

Auger electron (named after its discoverer, Pierre Auger). For elements <strong>of</strong><br />

low a<strong>to</strong>mic number, this Auger process is the more probable outcome and<br />

their x-ray fluorescence yield � is considerably less than one (�

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