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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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<strong>An</strong> <strong>Introduction</strong> <strong>to</strong> <strong>Microscopy</strong> 13<br />

Figure 1-9. First commercial <strong>TEM</strong> from the Siemens Company, employing three magnetic<br />

lenses that were water-cooled and energized by batteries. The objective lens used a focal<br />

length down <strong>to</strong> 2.8 mm at 80 kV, giving an estimated resolution <strong>of</strong> 10 nm.<br />

Although companies in the USA, Holland, UK, Germany, Japan, China,<br />

USSR, and Czechoslovakia have at one time manufactured transmission<br />

electron microscopes, competition has reduced their number <strong>to</strong> four: the<br />

Japanese <strong>Electron</strong> Optics Labora<strong>to</strong>ry (JEOL) and Hitachi in Japan,<br />

Philips/FEI in Holland/USA, and Zeiss in Germany.<br />

The further development <strong>of</strong> the <strong>TEM</strong> is illustrated by the two JEOL<br />

instruments shown in Fig. 1-10. Their model 100B (introduced around 1970)<br />

used both vacuum tubes and transis<strong>to</strong>rs for control <strong>of</strong> the lens currents and<br />

the high voltage (up <strong>to</strong> 100 kV) and gave a spatial resolution <strong>of</strong> 0.3 nm.<br />

Model 2010 (introduced 1990) employed integrated circuits and digital<br />

control; at 200 kV accelerating voltage, it provided a resolution <strong>of</strong> 0.2 nm.

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