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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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The Transmission <strong>Electron</strong> Microscope 77<br />

One disadvantage <strong>of</strong> the side-entry design is that mechanical vibration,<br />

picked up from the <strong>TEM</strong> column or from acoustical vibrations in the<br />

external air, is transmitted directly <strong>to</strong> the specimen. In addition, any thermal<br />

expansion <strong>of</strong> the specimen holder can cause drift <strong>of</strong> the specimen and <strong>of</strong> the<br />

<strong>TEM</strong> image. These problems have been largely overcome by careful design,<br />

including choice <strong>of</strong> materials used <strong>to</strong> construct the specimen holder. As a<br />

result, side-entry holders are widely used, even for high-resolution imaging.<br />

In a <strong>to</strong>p-entry stage, the specimen is clamped <strong>to</strong> the bot<strong>to</strong>m end <strong>of</strong> a<br />

cylindrical holder that is equipped with a conical collar; see Fig. 3-11b. The<br />

holder is loaded in<strong>to</strong> position through an airlock by means <strong>of</strong> a sliding and<br />

tilting arm, which is then detached and retracted. Inside the <strong>TEM</strong>, the cone<br />

<strong>of</strong> the specimen holder fits snugly in<strong>to</strong> a conical well <strong>of</strong> the specimen stage,<br />

which can be translated in the (x and y) horizontal directions by a precision<br />

gear mechanism.<br />

end-s<strong>to</strong>p<br />

specimen<br />

(a) Side-entry stage<br />

specimen<br />

highvacuum<br />

valve<br />

specimen holder<br />

specimen loading rod<br />

movable<br />

stage<br />

<strong>to</strong>p <strong>of</strong> objective lens<br />

specimen holder<br />

airlock<br />

airlock<br />

(b) Top-entry stage<br />

Figure 3-11. Schematic diagrams <strong>of</strong> (a) a side-entry and (b) a <strong>to</strong>p-entry specimen holder.

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