Physical Principles of Electron Microscopy: An Introduction to TEM ...

202 Index
Stacking fault, 114
Stage,
side-entry, 76
top-entry, 77
STEM, 18, 177
Steradian, 65
Stigmator, 52
condenser, 74
objective, 82, 145
SEM, 145
STM, 21
Surface replica, 103
Symmetry, axial, 34�39
Symmetry, crystal, 112
Synchrotron source, 10
TEM,
history, 11
construction, 57
Thickness fringes, 114
Thickness measurement, 174
Thin-film deposition, 122
Thin-lens approximation, 32
Thinning of specimens, 121
Topographic contrast,
in SEM, 131
in STM, 22
Tunneling, 21, 63
Ultrafast microscopy, 188
Ultramicrotome, 101, 120
Unit cell, 110
Units of length, 1
Vacancy clusters, 114
Vacuum system, 88
Viewing screen, 85
Water window, 10
Wavelength,
of electrons, 11, 117
of light, 2
Wehnelt electrode, 61
Wien filter, 183
Work function, 58
Working distance, 143
X-ray,
bremsstrahlung, 160
characteristic, 158
X-ray microscope, 9
X-ray spectroscopy, 158, 143
XEDS, 161
XWDS, 168
Y-modulation, 25
Yield,
backscattering, 137
fluorescence, 166
secondary-electron, 131
total-electron, 148
Z-contrast, 101
ZAF correction, 167
Zero-loss peak, 173
Zone plate, 9, 152