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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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66 Chapter 3<br />

�<br />

r<br />

r<br />

s<br />

r<br />

�<br />

(a) (b) (c)<br />

r<br />

r<br />

area A<br />

Figure 3-5. (a) Two-dimensional diagram defining angle � in radians. (b) Three-dimensional<br />

diagram defining solid angle � in steradians. (c) Cross-section through (b) showing the<br />

relationship between solid angle � and the corresponding half-angle � <strong>of</strong> the cone.<br />

Because image broadening due <strong>to</strong> spherical aberration <strong>of</strong> an electron lens<br />

increases as � 3 , the ability <strong>of</strong> a demagnifying lens <strong>to</strong> create a high current<br />

density within a small-diameter probe is helped by keeping � small and<br />

therefore by using an electron source <strong>of</strong> high brightness. In the scanning<br />

electron microscope, for example, we can achieve better spatial resolution by<br />

using a Schottky or field-emission source, whose brightness is considerably<br />

above that <strong>of</strong> a thermionic source (see Table 3-1).<br />

Equation (3.3) can also be used <strong>to</strong> define an electron-optical brightness �<br />

at any plane in an electron-optical system where the beam diameter is d and<br />

the convergence semi-angle is �. This concept is particularly useful because<br />

� retains the same value at each image plane, known as the principle <strong>of</strong><br />

brightness conservation. In other words,<br />

� = Je/� = I [�(d/2) 2 ] -1 (�� 2 ) -1 = source brightness = constant (3.4)<br />

Note that Eq. (3.4) is equivalent <strong>to</strong> saying that the product �d is the same at<br />

each plane. Brightness conservation remains valid when the system contains<br />

a diaphragm that absorbs some <strong>of</strong> the electrons. Although the beam current I<br />

is reduced at the aperture, the solid angle <strong>of</strong> the beam is reduced in the same<br />

proportion.<br />

The last row <strong>of</strong> Table 3-1 contains typical values <strong>of</strong> the energy spread �E<br />

for the different types <strong>of</strong> electron gun: the variation in kinetic energy <strong>of</strong> the<br />

emitted electrons. In the case <strong>of</strong> thermionic and Schottky sources, this<br />

energy spread is a reflection <strong>of</strong> the statistical variations in thermal energy <strong>of</strong><br />

electrons within the cathode, which depends on the cathode temperature T.<br />

In the case <strong>of</strong> a field-emission source, it is due <strong>to</strong> the fact that some electrons<br />

are emitted from energy levels (within the tip) that are below the Fermi<br />

level. In both cases, �E increases with emission current Ie (known as the<br />

�<br />

r<br />

�<br />

r<br />

s

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