Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
You also want an ePaper? Increase the reach of your titles
YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.
REFERENCES<br />
Binnig, G., Rohrer, H., Gerber, C., and Weibel, E., 1982, Surface studies by scanning<br />
tunneling microscopy. Phys. Rev. Lett. 49:57�60.<br />
Browning, N.D., Wallis, D.J., Nellist, P.D., and Pennycook, S.J., 1997, EELS in the S<strong>TEM</strong>:<br />
Determining the properties <strong>of</strong> materials on an a<strong>to</strong>mic scale. Micron 28:333�348.<br />
Brydson, R., 2001, <strong>Electron</strong> Energy Loss Spectroscopy. BIOS, Oxford.<br />
Davisson, C. and Germer, L.H., 1927, Diffraction <strong>of</strong> electrons by a crystal <strong>of</strong> nickel. Phys.<br />
Rev. 30:705�740.<br />
Eger<strong>to</strong>n, R.F., 1996, <strong>Electron</strong> Energy-Loss Spectroscopy in the <strong>Electron</strong> Microscope, 2nd ed.<br />
Springer, New York.<br />
Gabor, D., 1948, A new microscopic principle. Nature 161:777�778.<br />
Gauvin, R., Hoving<strong>to</strong>n, P., Drouin, D., Couture, A. R., Horny, P., and Demers, H., 2001,<br />
CASINO: a Monte Carlo Simulation <strong>of</strong> electron trajec<strong>to</strong>ry in solids. Available from<br />
http://www.gel.usherb.ca/casino/<br />
Glaeser, W., 1952, Foundations <strong>of</strong> <strong>Electron</strong> Optics (in German). Springer-Verlag, Vienna.<br />
Goodhew, P.J., 1985, Thin Foil Preparation for <strong>Electron</strong> <strong>Microscopy</strong>, Elsevier, Amsterdam.<br />
Hashimo<strong>to</strong>, H., Endoh, H., Tanji, T., Ono, A., and Watanabe, E., 1977, Direct observation <strong>of</strong><br />
fine structure within images <strong>of</strong> a<strong>to</strong>ms in crystals by transmission electron microscopy. J.<br />
Phys. Soc. Japan 42:179.<br />
Joy, D.C., and Joy, C.S., 1996, Low-voltage scanning electron microscopy. Micron 27:<br />
247�263.<br />
Knoll, M., and Ruska, E., 1932, Contribution <strong>to</strong> geometrical electron optics (in German).<br />
<strong>An</strong>nalen der Physik 5:607�661.<br />
Lobas<strong>to</strong>v, M., Srinivasan, R., and Zewail, A.H.., 2005, Four-dimensional ultrafast electron<br />
microscopy. Proc. Nat. Acad. Sci. 102:7069�7073.<br />
Maxwell, J. C., 1858, On the general laws <strong>of</strong> optical instruments. Quarterly Journal <strong>of</strong> Pure<br />
and Applied Mathematics 2:233�246.<br />
Muller, D.A., and Grazul, J., 2001, Optimizing the environment for sub-0.2nm scanning<br />
transmission electron microscopy. J. <strong>Electron</strong> Microsc. 50:219�226.<br />
Neuhausler, U., Abend, S., Jacobsen, C., and G. Lagaly, G., 1999, S<strong>of</strong>t x-ray spectromicroscopy<br />
on solid-stabilized emulsions. Colloid. Polym. Sci. 277:719�726.