Physical Principles of Electron Microscopy: An Introduction to TEM ...

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Ray F. Egerton Department of Physics, University of Alberta 412 Avadh Bhatia Physics Laboratory Edmonton, Alberta, Canada T6G 2R3 Library of Congress Control Number: 2005924717 ISBN-10: 0-387-25800-0 Printed on acid-free paper. ISBN-13: 978-0387-25800-0 © 2005 Springer Science+Business Media, Inc. All rights reserved. This work may not be translated or copied in whole or in part without the written permission of the publisher (Springer Science+Business Media, Inc., 233 Spring St., New York, NY 10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks, and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights. Printed in the United States of America. (EB) 987654321 springeronline.com
To Maia
Page 3: Ray F. Egerton Physical Principles
Page 7 and 8: viii Contents 3.3 Condenser-Lens Sy
Page 9 and 10: PREFACE The telescope transformed o
Page 11 and 12: Chapter 1 AN INTRODUCTION TO MICROS
Page 13 and 14: An Introduction to Microscopy 3 In
Page 15 and 16: An Introduction to Microscopy 5 Cha
Page 17 and 18: An Introduction to Microscopy 7 eye
Page 19 and 20: An Introduction to Microscopy 9 can
Page 21 and 22: An Introduction to Microscopy 11 1.
Page 23 and 24: An Introduction to Microscopy 13 Fi
Page 33 and 34: An Introduction to Microscopy 23 A
Page 35 and 36: An Introduction to Microscopy 25 el
Page 37 and 38: 28 Chapter 2 Rule 1 states that for
Page 39 and 40: 30 Chapter 2 that is curved rather
Page 41 and 42: 32 Chapter 2 x 0 object principal p
Page 43 and 44: 34 Chapter 2 2.3. Imaging with Elec
Page 45 and 46: 36 Chapter 2 cross-product or vecto
Page 47 and 48: 38 Chapter 2 important to remember
Page 49 and 50: 40 Chapter 2 A cross section throug
Page 51 and 52: 42 Chapter 2 As an example, we can
Page 53 and 54: 44 Chapter 2 microscopes, at a time
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46 Chapter 2 When these non-paraxia
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48 Chapter 2 So far, we have said n
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50 Chapter 2 from the lens) for ele
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52 Chapter 2 P (a) P (b) y y x x +V
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54 Chapter 2 The stigmators found i
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Chapter 3 THE TRANSMISSION ELECTRON
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The Transmission Electron Microscop
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Chapter 4 TEM SPECIMENS AND IMAGES
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TEM Specimens and Images 95 v 0 m M
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TEM Specimens and Images 97 In prac
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TEM Specimens and Images 99 P e (>
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TEM Specimens and Images 101 4.4 Sc
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TEM Specimens and Images 103 Figure
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TEM Specimens and Images 105 as see
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TEM Specimens and Images 107 dimens
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TEM Specimens and Images 109 (discu
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TEM Specimens and Images 111 Figure
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TEM Specimens and Images 113 core,
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TEM Specimens and Images 115 unders
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TEM Specimens and Images 117 underf
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TEM Specimens and Images 119 From t
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TEM Specimens and Images 121 (a) (b
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TEM Specimens and Images 123 of a s
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Chapter 5 THE SCANNING ELECTRON MIC
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The Scanning Electron Microscope 12
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156 Chapter 6 where h = 6.63 � 10
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158 Chapter 6 Many-electron atoms r
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160 Chapter 6 Figure 6-2 also demon
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162 Chapter 6 x-ray computer & disp
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164 Chapter 6 Ideally, each peak in
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166 Chapter 6 to balance the units
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168 Chapter 6 a three-dimensional d
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170 Chapter 6 to be analyzed, where
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172 Chapter 6 different from the co
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174 Chapter 6 A typical energy-loss
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Chapter 7 RECENT DEVELOPMENTS 7.1 S
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Recent Developments 179 Figure 7-2.
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Recent Developments 181 below 0.1 n
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Recent Developments 183 one type of
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Recent Developments 185 Besides hav
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Recent Developments 187 Figure 7-7.
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Recent Developments 189 holder cont
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192 Appendix cathode vacuum + + + +
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194 Appendix The variable � repre
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196 References Neutze, R., Wouts, R
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198 Index Bright-field image, 100 B
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200 Index Inner-shell ionization, 1
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202 Index Stacking fault, 114 Stage
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